Patents by Inventor Stephan Sauter

Stephan Sauter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuit configuration and method for assessing capacitances in matrices
    Patent number: 6870373
    Abstract: A circuit configuration for assessing capacitances in a matrix, which has a number of rows with at least one capacitance in at least one dimension, includes a test arm connected to first electrodes of each of the capacitances to be assessed and by which two different potentials can be applied to the first electrodes, a measurement arm connected to second electrodes of each of the capacitances to be assessed and that has a first measurement path and a second measurement path connected to a common potential. The first measurement path has an instrument for assessing the capacitances and the first and second measurement paths can be connected to the second electrodes. The circuit configuration has a drive device that connects each of the capacitances to be assessed individually to the two different potentials.
    Type: Grant
    Filed: September 6, 2002
    Date of Patent: March 22, 2005
    Assignee: Infineon Technologies AG
    Inventors: Ute Kollmer, Stephan Sauter, Carsten Linnenbank, Roland Thewes
  • Circuit configuration and method for assessing capacitances in matrices
    Publication number: 20030062905
    Abstract: A circuit configuration for assessing capacitances in a matrix, which has a number of rows with at least one capacitance in at least one dimension, includes a test arm connected to first electrodes of each of the capacitances to be assessed and by which two different potentials can be applied to the first electrodes, a measurement arm connected to second electrodes of each of the capacitances to be assessed and that has a first measurement path and a second measurement path connected to a common potential. The first measurement path has an instrument for assessing the capacitances and the first and second measurement paths can be connected to the second electrodes. The circuit configuration has a drive device that connects each of the capacitances to be assessed individually to the two different potentials.
    Type: Application
    Filed: September 6, 2002
    Publication date: April 3, 2003
    Inventors: Ute Kollmer, Stephan Sauter, Carsten Linnenbank, Roland Thewes