Patents by Inventor Stephan von Appen

Stephan von Appen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Process and a device for the calibration of a semiconductor component test system
    Publication number: 20060028225
    Abstract: The invention relates to a device, in particular a probe card to be used for the testing of semi-conductor components, and/or a device, in particular a probe card, to be used in the calibration of a semi-conductor component test system and/or of a semi-conductor component test apparatus, a contact mechanism, in particular a wafer, as well as a process to be used in the calibration of a semi-conductor component test system and/or of a semi-conductor component test apparatus. The device and/or the probe card comprises a calibration device or parts of a calibration device, in particular a standard and/or reference comparator device and/or a standard and/or a reference driver device.
    Type: Application
    Filed: July 21, 2005
    Publication date: February 9, 2006
    Applicant: INFINEON TECHNOLOGIES AG
    Inventor: Stephan von Appen