Abstract: A method for determining the position of an object (1) in space is described, in which measurement characteristics (4) of the object (1) are recorded with an optical recording device (3) calibrated to a space coordinate system (5), and on the basis of these measurement characteristics (4), the position of the object (1) in the space coordinate system (5) is determined in an image processing device. To enable reliable ascertainment of the position even with only a few recording devices, it is provided that at least two measurement characteristics (4) of the object (1) are detected simultaneously in a recording device (3) and used to determine the position of the object (1).

Abstract: The invention describes a method for measuring the shape of a reflective surface (14) and a corresponding system which has at least one pattern (15) for reflection at the reflective surface (14) and at least one camera (1) for viewing the pattern (15) which is reflected at the surface (14) pixel by pixel, wherein the position and orientation of the camera (1) and of the pattern (15) are known. In order to reliably measure the shape of reflective surfaces with a small amount of equipment complexity, the viewing directions of the camera (1), which are known for the pixels (8), and the positions of the pattern (15), which correspond to the mapping of the reflected pattern (15) to pixels (8) of the camera (1), are used to determine the surface angle and surface height for the purpose of measuring the shape.

Abstract: The invention relates to a method for planning an inspection path (2) for at least one optical picture-taking device (4), particularly a camera, for inspecting a three-dimensional object (3). The picture-taking device (4) and the object (3) are movable relative to each other by means of a displacement device (5, 6).

Abstract: The invention describes a method for measuring the shape of a reflective surface (14) and a corresponding system which has at least one pattern (15) for reflection at the reflective surface (14) and at least one camera (1) for viewing the pattern (15) which is reflected at the surface (14) pixel by pixel, wherein the position and orientation of the camera (1) and of the pattern (15) are known. In order to reliably measure the shape of reflective surfaces with a small amount of equipment complexity, the viewing directions of the camera (1), which are known for the pixels (8), and the positions of the pattern (15), which correspond to the mapping of the reflected pattern (15) to pixels (8) of the camera (1), are used to determine the surface angle and surface height for the purpose of measuring the shape.

Abstract: In the method for locating flaws on the surface of a three-dimensional object the flaws are detected and located using one or more optical image-taking device. When a picture is taken showing a flaw the location of the flaw on the object is determined with great accuracy from the design data for the object, the optical imaging properties of the optical image-taking device, and the positions of the optical image-taking device and the object. A marking system for marking the position of the flaws on the object, which are detected by the method, is also described, which includes plural marking heads and displacement devices for positioning and/or activating the marking heads independently of each other.

Abstract: A method for determining the position of an object (1) in space is described, in which measurement characteristics (4) of the object (1) are recorded with an optical recording device (3) calibrated to a space coordinate system (5), and on the basis of these measurement characteristics (4), the position of the object (1) in the space coordinate system (5) is determined in an image processing device. To enable reliable ascertainment of the position even with only a few recording devices, it is provided that at least two measurement characteristics (4) of the object (1) are detected simultaneously in a recording device (3) and used to determine the position of the object (1).

Abstract: The present invention relates to a method and a marking system for locating flaws on a three-dimensional object (2), particularly on its surface, the defective points being detected and located using an optical picture-taking device (3,4). To locate a flaw with great accuracy, it is provided that the design data related to the object (2), the optical imaging properties of the picture-taking device (3,4), and the position of the optical picture-taking device (3, 4) and the object (2) are known when the picture is taken, and that the location of the flaw on the object (2) is determined and optionally marked.

Abstract: The invention relates to a method for planning an inspection path (2) for at least one optical picture-taking device (4), particularly a camera, for inspecting a three-dimensional object (3). The picture-taking device (4) and the object (3) are movable relative to each other by means of a displacement device (5, 6).