Patents by Inventor Stephan Wuensche

Stephan Wuensche has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for performing a burn-in test
    Patent number: 7463548
    Abstract: A DDR DRAM having a test mode and an operational mode and a method for testing the DDR DRAM. The method includes in the order recited: (a) placing the DDR DRAM in test mode; (b) issuing a bank activate command to select and bring up a wordline selected for write of the DDR DRAM; (c) writing with auto-precharge, a test pattern to cells of the DDR DRAM; (d) repeating steps (b) and (c) until all wordlines for write have been selected; (e) issuing a bank activate command to select and bring up a wordline selected for read of the DDR DRAM; (f) reading with auto-precharge, the stored test pattern from cells of the DDR DRAM; and (g) repeating steps (e) and (f) until all wordlines for read have been selected.
    Type: Grant
    Filed: March 19, 2007
    Date of Patent: December 9, 2008
    Assignees: International Business Machines Corporation, Infineon Technologies AG
    Inventors: Alan D. Norris, Samuel Weinstein, Stephan Wuensche
  • Method for performing a burn-in test
    Patent number: 7243276
    Abstract: A DDR DRAM having a test mode and an operational mode and a method for testing the DDR DRAM. The method includes in the order recited: (a) placing the DDR DRAM in test mode; (b) issuing a band activate command to select and bring up a wordline selected for write of the DDR DRAM; (c) writing with auto-precharge, a test pattern to cells of the DDR DRAM; (d) repeating steps (b) and (c) until all wordlines for write have been selected; (e) issuing a bank activate command to select and bring up a wordline selected for read of the DDR DRAM; (f) reading with auto-precharge, the stored test pattern from cells of the DDR DRAM; and (g) repeating steps (c) and (f) until all wordlines for read have been selected.
    Type: Grant
    Filed: November 6, 2003
    Date of Patent: July 10, 2007
    Assignee: International Business Machines Corporation
    Inventors: Alan D. Norris, Samuel Weinstein, Stephan Wuensche
  • METHOD FOR PERFORMING A BURN-IN TEST
    Publication number: 20050102590
    Abstract: A method for testing a DDR DRAM having a test mode and an operational mode is described. The method including in the order recited: (a) placing the DDR DRAM in test mode; (b) issuing a bank activate command to select and bring up a wordline selected for write of the DDR DRAM; (c) writing with auto-precharge, a test pattern to cells of the DDR DRAM; (d) repeating steps (b) and (c) until all wordlines for write have been selected; (e) issuing a bank activate command to select and bring up a wordline selected for read of the DDR DRAM; (f) reading with auto-precharge, the stored test pattern from cells of the DDR DRAM; and (g) repeating steps (e) and (f) until all wordlines for read have been selected.
    Type: Application
    Filed: November 6, 2003
    Publication date: May 12, 2005
    Applicants: INTERNATIONAL BUSINESS MACHINES CORPORATION, INFINEON TECHNOLOGIES NORTH AMERICA CORP
    Inventors: Alan Norris, Samuel Weinstein, Stephan Wuensche