Abstract: A method and a microscopy imaging apparatus for generating an optically sectioned image of a specimen are provided. The method comprises the steps of: illuminating the specimen with a modulating, spatially periodic illumination pattern; imaging said specimen on a conjugate image plane; acquiring a plurality of signals at respective positions on said image plane, each signal corresponding to the incident light intensity at that position and having an oscillatory component caused by the modulation of the illumination pattern; and measuring a characteristic of the oscillatory component of each of the signals, whereby the measured characteristics when combined in their relative positions generate an optically sectioned image of the specimen.

Abstract: A method and a microscopy imaging apparatus for generating an optically sectioned image of a specimen are provided. The method comprises the steps of: illuminating the specimen with a modulating, spatially periodic illumination pattern; imaging said specimen on a conjugate image plane; acquiring a plurality of signals at respective positions on said image plane, each signal corresponding to the incident light intensity at that position and having an oscillatory component caused by the modulation of the illumination pattern; and measuring a characteristic of the oscillatory component of each of the signals, whereby the measured characteristics when combined in their relative positions generate an optically sectioned image of the specimen.

Abstract: The on-chip electrical circuit (1) for the detection of modulated signals (I), e.g., light, comprises sensor means (PS), e.g., a photosensor, and feedback means (FB) including a low-pass frequency filter. The circuit (1) further comprises a voltage-controlled current source (CS), the input of which is connected to the output of the feedback means (FB) and the output of which is connected in series with the photosensor (PS) in a common node. The common node is connected to the input of an amplifier (AMP). The output of the amplifier (AMP) may be connected to a rectifier (RF), followed by a low-pass filter (LPF). A plurality of such electrical detection circuits (1) with parallel outputs can form a one-dimensional or two-dimensional array sensor for the coherent or heterodyne analog detection of intensity modulated optical signals simultaneously for all pixels with a high dynamic range. The array sensor may be used, e.g.

Abstract: A tomographic interferometer device in which a spectral light source lights an object to create an object beam originating from that object. A stepped optical block is also exposed to the source to create a plurality of individual reference beams having different path lengths. The object beam and reference beams are made to interfere and the resulting light is sent to an array of side by side photodetectors.