Patents by Inventor Stephane Thuriés

Stephane Thuriés has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Embedded test circuitry and method therefor
    Patent number: 11018635
    Abstract: A circuit (200) for testing failure of a connection between a radio frequency, RF, integrated circuit (201) and external circuitry (204), the circuit comprising: an amplifier (205) having first and second input paths (215, 216) and first and second output paths (206, 207); a first power detector (208, 209) coupled to one of said first or second output paths; at least one connection (211) between said first and second output paths (206, 207) and said external circuitry (204), connecting said outputs to a RF combiner (210) said external circuitry; at least one disabling circuit (230, 232, 234, 236, 240, 242, 260, 262) coupled to at least one of said first and second output paths (206, 207) or at least one of said first and second input path (215, 216), before said path reaches said power detector (208, 209); for disabling one of said inputs or outputs; wherein when said input or output path is disabled (206, 207), and a signal is output along the enabled output path (206, 207), the power detector (208, 209) on
    Type: Grant
    Filed: July 26, 2019
    Date of Patent: May 25, 2021
    Assignee: NXP USA, INC.
    Inventors: Stephane Thuriés, Birama Goumballa, Cristian Pavao Moreira