Patents by Inventor Stephen A. Cannon

Stephen A. Cannon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8089392
    Abstract: Integration of ionospheric models in over the horizon radars (OTHR) is achieved with very little or substantially no change to existing coordinate registration systems or software by specifying a virtual transponder at a target location and generating a signal which appears to have emanated from a transponder at that location. A return path to said virtual transponder is ray-traced through the ionospheric model to produce propagation parameters; and an appropriately delayed virtual transponder signal is inserted into the receiver. The result produced at the receiver is used to perform coordinate registration for further received signals.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: January 3, 2012
    Assignee: Qinetiq Limited
    Inventor: Paul Stephen Cannon
  • Patent number: 8010856
    Abstract: In a method for determining a number of possible hold time faults in a scan chain of a DUT, an environmental variable of the scan chain is set to a value believed to cause a hold time fault in the scan chain, and then a pattern is shifted through the scan chain. The pattern has a background pattern of at least n contiguous bits of a first logic state, followed by at least one bit of a second logic state, where n is a length of the scan chain. The number of possible hold time faults in the scan chain can be determined as a difference between i) a clock cycle when the at least one bit is expected to cause a transition at an output of the scan chain, and ii) a clock cycle when the at least one bit actually causes a transition at the output of the scan chain. If a value of the environmental variable at which the scan chain operates correctly can be determined, the location of one or more hold time faults can also be determined.
    Type: Grant
    Filed: March 31, 2008
    Date of Patent: August 30, 2011
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventors: Stephen A. Cannon, Richard C. Dokken, Alfred L. Crouch, Gary A. Winblad
  • Patent number: 7853846
    Abstract: A method for determining that failures in semiconductor test are due to a defect potentially causing a hold time violation in a scan cell in a scan chain, counting the number of potential defects, and, if possible, localizing, and ameliorating hold time defects in a scan chain.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: December 14, 2010
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventors: Stephen A. Cannon, Richard C. Dokken, Alfred L. Crouch, Gary A. Winblad
  • Publication number: 20100156703
    Abstract: Integration of ionospheric models in over the horizon radars (OTHR) is achieved with very little or substantially no change to existing coordinate registration systems or software by specifying a virtual transponder at a target location and generating a signal which appears to have emanated from a transponder at that location. A return path to said virtual transponder is ray-traced through the ionospheric model to produce propagation parameters; and an appropriately delayed virtual transponder signal is inserted into the receiver. The result produced at the receiver is used to perform coordinate registration for further received signals.
    Type: Application
    Filed: May 30, 2008
    Publication date: June 24, 2010
    Applicant: QINETIQ LIMITED
    Inventor: Paul Stephen Cannon
  • Publication number: 20090113265
    Abstract: A method for determining that failures in semiconductor test are due to a defect potentially causing a hold time violation in a scan cell in a scan chain, counting the number of potential defects, and, if possible, localizing, and ameliorating hold time defects in a scan chain.
    Type: Application
    Filed: October 31, 2007
    Publication date: April 30, 2009
    Applicant: INOVYS CORPORATION
    Inventors: Stephen A. Cannon, Richard C. Dokken, Alfred L. Crouch, Gary A. Winblad
  • Publication number: 20090113263
    Abstract: In a method for determining a number of possible hold time faults in a scan chain of a DUT, an environmental variable of the scan chain is set to a value believed to cause a hold time fault in the scan chain, and then a pattern is shifted through the scan chain. The pattern has a background pattern of at least n contiguous bits of a first logic state, followed by at least one bit of a second logic state, where n is a length of the scan chain. The number of possible hold time faults in the scan chain can be determined as a difference between i) a clock cycle when the at least one bit is expected to cause a transition at an output of the scan chain, and ii) a clock cycle when the at least one bit actually causes a transition at the output of the scan chain. If a value of the environmental variable at which the scan chain operates correctly can be determined, the location of one or more hold time faults can also be determined.
    Type: Application
    Filed: March 31, 2008
    Publication date: April 30, 2009
    Inventors: Stephen A. Cannon, Richard C. Dokken, Alfred L. Crouch, Gary A. Winblad