Abstract: Method and system that test device sensitivity according to whether the device passes or fails when subjected to a test signal. The device may be repeatedly subjected to test signal at varying operating parameters in order to assess pass-fail threshold at which the device transitions from operating properly/improperly to operating improperly/properly.

Abstract: Method and system that test device sensitivity according to whether the device passes or fails when subjected to a test signal. The device may be repeatedly subjected to test signal at varying operating parameters in order to assess pass-fail threshold at which the device transitions from operating properly/improperly to operating improperly/properly.

Abstract: A method for making measurements using a vector network analyzer, and for multi-port S-parameter and T-parameter conversion includes a generalized T-matrix definition that facilitates the conversion between the S-parameters and the T-parameters for multi-port networks based on the well understood and mathematically simple 2-port relations. One contemplated approach generalizes all multi-port networks into two cases: balanced and unbalanced. Through careful selection of the T-matrix, the contemplated method extends 2-port symmetry to multi-port networks and provides an engineering implementable relationship between the S- and T-parameters for multi-port networks. This symmetry extension allows a practical means to cascade and de-embed such networks.