Abstract: A pattern selection system for a sewing machine is provided by which operator influenced closure of a single electric switch can effect the selection of any one of a multiplicity of stitch patterns stored in an electronic memory in the sewing machine. Pattern selection can be effected either by repeated closure of the single switch, by a scanning system rendered effective by continuous closure of the single switch, or by a combination of both of these modes. This system is compatible with the provision of additional individual pattern selection switches for selecting special or frequently utilized individual patterns.

Abstract: In a sewing machine in which any one of a variety of stitch patterns, each of which may have a different number of successive needle penetrations, may be produced repetitively, an operator influenced control is disclosed capable of limiting the operation of the sewing machine to the stitching of a single execution of any selected stitch pattern. After the stitching of the single pattern has been completed, further operation of the sewing machine is inhibited by suspension of needle reciprocation, needle jogging and work feed motion.