Patents by Inventor Stephen C. Strickland

Stephen C. Strickland has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210183632
    Abstract: A technique for sample analysis includes capturing an image of an analysis location of a sample disposed within a sample chamber using an imaging device having a field of view into the sample chamber along an axis. Subsequent to capturing the image, a material removal beam is directed along the axis the sample to desorb or ablate sample material from the sample at the analysis location. An ionization beam is then applied to the sample material to generate ionized sample material and the ionized sample material is delivered to a mass spectrometer for analysis. Each of organic and inorganic analysis may be conducted at a given analysis location by desorbing and analyzing organic material and subsequently ablating and analyzing inorganic material, the desorption and ablation processes performed using beams delivered along the same axis as the imaging device's field of view.
    Type: Application
    Filed: February 26, 2021
    Publication date: June 17, 2021
    Applicant: Exum Instruments
    Inventors: Jeffrey T. Williams, Oleg V. Maltsev, Gurpreet Singh, Stephen C. Strickland, Cole D. Naymark, Jonathan Putman, Jens Cole