Abstract: An optical Boresight alignment device that leverages creation of an opto-mechanical reference to the rifle barrel so that the riflescope can be used to directly measure the axis of the rifle barrel and thereby offer the necessary feedback to precisely boresight the riflescope. An illumination multiplexer module (IMM) allows the riflescope to function as an illuminated precision autocollimator with which to optically measure the barrel angle. The present invention leverages the two most accurate rifle components: the barrel and the riflescope themselves to directly measure the axes of each device, the optical (riflescope) and the mechanical (barrel). This is an improvement over existing methods by successfully using the external surface of the rifle barrel as a kinematic mechanical reference.

Abstract: A method and system of retro-emission include a microlens array to focus light of a first wavelength on a layer of luminescent material configured to emit light of a second wavelength when excited by a light of the first wavelength.

Abstract: Optical devices for guiding illumination are provided each having a body of optical material with staircase or acutely angled ramp structures on its top surface for distributing light inputted from one end of the device from the front exit faces of such structures along certain angular orientations, while at least a substantial portion of the light is totally internally reflected within the body until distributed from such front exit faces. Optical devices are also provided each have a body of optical material having a bottom surface with acutely angled ramp structures and falling structures which alternate with each other, such that light is totally internally reflected within the device until reflected by such ramp structures along the bottom surface to exit the top surface of the device or transmitted through the ramp structures to an adjacent falling structure back into the device.

Abstract: An imaging system on which a calibration method is practiced includes: a light source; a substrate for supporting an object; a patterning mask that generates a substantially periodic spatial pattern on the object; a phase shifter that adjusts the relative position of the patterning mask and object to shift the position of the pattern on the object; a detector that detects images of the object; and an analyzer that analyzes at least three images of the object, each of which represents a different spatial shift of the pattern, the analyzer being configured to remove the spatial pattern from the images to generate an optically sectioned image of the object. The calibration method includes: calibrating the position of the mask relative to the substrate via a phase-voltage technique; calibrating the position of the mask relative to the substrate via a merit function technique; and operating the calibrated imaging system.