Abstract: Memory systems with burst mode having logic gates as sense elements and related methods are provided. A memory system comprises a memory array including a first set of memory cells coupled to a first wordline, a second set of memory cells coupled to a second wordline, and a plurality of sense elements, not including any sense amplifiers. The control unit is configured to generate control signals for: in response to a burst mode read request, simultaneously: (1) asserting a first wordline signal on the first wordline coupled to each of a plurality of first set of bitlines, and (2) asserting a second wordline signal on the second wordline coupled to each of a plurality of second set of bitlines, and as part of a burst, outputting data corresponding to a subset of each of the first set of memory cells and the second set of memory cells.

Abstract: Memory systems with burst mode having logic gates as sense elements and related methods are provided. A memory system comprises a memory array including a first set of memory cells coupled to a first wordline, a second set of memory cells coupled to a second wordline, and a plurality of sense elements, not including any sense amplifiers. The control unit is configured to generate control signals for: in response to a burst mode read request, simultaneously: (1) asserting a first wordline signal on the first wordline coupled to each of a plurality of first set of bitlines, and (2) asserting a second wordline signal on the second wordline coupled to each of a plurality of second set of bitlines, and as part of a burst, outputting data corresponding to a subset of each of the first set of memory cells and the second set of memory cells.

Abstract: Memory systems having flying bitlines for improved burst mode read operations and related methods are provided. A memory system comprises a memory array including a first set of memory cells coupled to a first inner wordline and a second set of memory cells coupled to a first outer wordline. The memory system includes a control unit configured to generate control signals for simultaneously: asserting a first wordline signal on the first inner wordline coupled to each of a plurality of inner bitlines, and asserting a second wordline signal on the first outer wordline coupled to each of a plurality of outer bitlines, where each of the plurality of outer bitlines includes a first portion configured to fly over or fly under a corresponding inner bitline, and outputting data from each of the first set of memory cells and the second set of memory cells as part of a burst.

Abstract: Memory systems with burst mode having logic gates as sense elements and related methods are provided. A memory system comprises a memory array including a first set of memory cells coupled to a first wordline, a second set of memory cells coupled to a second wordline, and a plurality of sense elements, not including any sense amplifiers. The control unit is configured to generate control signals for: in response to a burst mode read request, simultaneously: (1) asserting a first wordline signal on the first wordline coupled to each of a plurality of first set of bitlines, and (2) asserting a second wordline signal on the second wordline coupled to each of a plurality of second set of bitlines, and as part of a burst, outputting data corresponding to a subset of each of the first set of memory cells and the second set of memory cells.

Abstract: Memory systems having flying bitlines for improved burst mode read operations and related methods are provided. A memory system comprises a memory array including a first set of memory cells coupled to a first inner wordline and a second set of memory cells coupled to a first outer wordline. The memory system includes a control unit configured to generate control signals for simultaneously: asserting a first wordline signal on the first inner wordline coupled to each of a plurality of inner bitlines, and asserting a second wordline signal on the first outer wordline coupled to each of a plurality of outer bitlines, where each of the plurality of outer bitlines includes a first portion configured to fly over or fly under a corresponding inner bitline, and outputting data from each of the first set of memory cells and the second set of memory cells as part of a burst.

Abstract: Systems and methods for pulse generation in a dual voltage domain include a first and a second voltage aware branch sensitive to a low voltage domain. The first voltage aware branch includes an inverter in the low voltage domain for delaying a leading edge of an output pulse in a high voltage domain from a leading edge of an input pulse in the high voltage domain. The second voltage aware branch includes a delay element in the low voltage domain for extending a pulse width of the output pulse in the high voltage domain from a pulse width of the input pulse.

Abstract: Systems and methods are directed to managing signals in a dual voltage domain comprising a high voltage domain and a low voltage domain. A write bitline driver circuit receives complementary global write bitline signals as input signals from a global write bitline driver in the low voltage domain, and a write enable signal as an input signal in the high voltage domain. The write bitline driver circuit generates complementary local write bitline signals as output signals in the high voltage domain for activating bitlines of a memory bank in the high voltage domain. The complementary local write bitline signals are based on the complementary global write bitline signals, voltage level shifted from the low voltage domain to the high voltage domain and gated by the write enable signal.

Abstract: Voltage level shifters employing preconditioning circuits are disclosed. Related systems and methods are also disclosed. In one aspect, voltage level shifter is configured to generate a voltage level shifted non-complement output signal and complement output signal corresponding to non-complement input signal and complement input signal, respectively. First pull-up circuit is configured to generate complement output signal in response to non-complement input signal transitioning to logic low voltage. First pull-down circuit is configured to generate non-complement output signal in response to complement input signal transitioning to logic high voltage. First preconditioning circuit is configured to receive non-complement and complement output signals and generate and provide shifted voltage signal to complement output in response to non-complement output signal transitioning to logic low voltage. This allows the complement output signal to transition to the shifted voltage more quickly.

Abstract: Systems and methods relate to memory operations in a memory array. A compare operation is performed using a sense amplifier. True and complement versions of a search bit are compared with true and complement versions of a data bit stored in a data row of the memory array to generate true and complement sense amplifier inputs. The true and complement sense amplifier inputs are amplified in the sense amplifier to generate a single-ended match signal. The single-ended match signal can be aggregated with other single-ended match signals in the data row to determine whether there is a hit or miss for a compare operation on the entire data row.

Abstract: Dynamic voltage level shifters employing pulse generation circuits are disclosed. In one aspect, a dynamic voltage level shifter includes a dynamic voltage level shifting circuit. The dynamic voltage level shifting circuit includes a pre-charge circuit configured to provide supply voltage of a first voltage domain to a dynamic node in response to a clock signal having pre-charge voltage. An evaluate circuit is configured to provide ground voltage to the dynamic node in response to an input signal having an active voltage while the clock signal has evaluate voltage. A keeper circuit is configured to provide a reduced drive strength to the dynamic node in response to pulse signal. The pulse signal is generated by a pulse generation circuit, wherein a pulse width of the pulse signal correlates to a difference in supply voltages of first and second voltage domains.

Abstract: Dynamic voltage level shifters employing pulse generation circuits are disclosed. In one aspect, a dynamic voltage level shifter includes a dynamic voltage level shifting circuit. The dynamic voltage level shifting circuit includes a pre-charge circuit configured to provide supply voltage of a first voltage domain to a dynamic node in response to a clock signal having pre-charge voltage. An evaluate circuit is configured to provide ground voltage to the dynamic node in response to an input signal having an active voltage while the clock signal has evaluate voltage. A keeper circuit is configured to provide a reduced drive strength to the dynamic node in response to pulse signal. The pulse signal is generated by a pulse generation circuit, wherein a pulse width of the pulse signal correlates to a difference in supply voltages of first and second voltage domains.

Abstract: An asynchronous memory includes a memory array, a sense amplifier, an output latch, and a controller. In response to a clock signal from an external circuit requesting a read operation, the controller provides the clock signal to the memory array to read data, and controls the sense amplifier and the output latch to provide the functionality of a flip-flop master and slave so that the read operation delay through the output latch to the external circuit is removed from a first read cycle of two sequential read cycles.

Abstract: Voltage level shifters employing preconditioning circuits are disclosed. Related systems and methods are also disclosed. In one aspect, voltage level shifter is configured to generate a voltage level shifted non-complement output signal and complement output signal corresponding to non-complement input signal and complement input signal, respectively. First pull-up circuit is configured to generate complement output signal in response to non-complement input signal transitioning to logic low voltage. First pull-down circuit is configured to generate non-complement output signal in response to complement input signal transitioning to logic high voltage. First preconditioning circuit is configured to receive non-complement and complement output signals and generate and provide shifted voltage signal to complement output in response to non-complement output signal transitioning to logic low voltage. This allows the complement output signal to transition to the shifted voltage more quickly.

Abstract: An asynchronous memory includes a memory array, a sense amplifier, an output latch, and a controller. In response to a clock signal from an external circuit requesting a read operation, the controller provides the clock signal to the memory array to read data, and controls the sense amplifier and the output latch to provide the functionality of a flip-flop master and slave so that the read operation delay through the output latch to the external circuit is removed from a first read cycle of two sequential read cycles.

Abstract: Embodiments disclosed include redirecting data from a defective data entry in memory to a redundant data entry prior to data access. Related systems and methods are also disclosed. The memory is configured to receive a memory access request. The received memory access request comprises a data entry address. The memory uses the data entry address to access data stored in a data array in the memory in a first data access path. It is possible that the rows or columns in the memory may be defective as a result of a manufacturing process. In the event that a row or column at the data entry address in the data array is defective, a data entry redirection circuit redirects the memory access request to a redundant row or column in the data array prior to data access.

Abstract: Systems and methods for generating voltage level shifted self-clocked write assistance include a circuit with self-clocked true and complement data input signals in a first voltage domain. First and second full voltage level shifters are configured to generate voltage level shifted self-clocked intermediate true and complement signals in a second voltage domain, based on the self-clocked true and complement data input signals in the first voltage domain. Tristating logic including first and second complementary metal oxide semiconductor (CMOS) circuits are configured to generate voltage level shifted self-clocked tristated true and complement output signals used for providing write assistance for a memory array in the second voltage domain, based on the voltage level shifted self-clocked intermediate true and complements signals.

Abstract: Systems and methods for generating voltage level shifted self-clocked write assistance include a circuit with self-clocked true and complement data input signals in a first voltage domain. First and second full voltage level shifters are configured to generate voltage level shifted self-clocked intermediate true and complement signals in a second voltage domain, based on the self-clocked true and complement data input signals in the first voltage domain. Tristating logic including first and second complementary metal oxide semiconductor (CMOS) circuits are configured to generate voltage level shifted self-clocked tristated true and complement output signals used for providing write assistance for a memory array in the second voltage domain, based on the voltage level shifted self-clocked intermediate true and complements signals.

Abstract: Static random access memory (SRAM) global bitline circuits for reducing glitches during read accesses, and related methods and systems are disclosed. A global bitline scheme in SRAM can reduce output load, reducing power consumption. In certain embodiments, SRAM includes an SRAM array. The SRAM includes a global bitline circuit for each SRAM array column. Each global bitline circuit includes memory access circuit that pre-charges local bitlines corresponding to bitcells in SRAM array. The data read from selected bitcell is read from its local bitline onto aggregated read bitline, an aggregation of local bitlines. The SRAM includes bitline evaluation circuit that sends data from aggregated read bitline onto global bitline. Instead of sending data based on rising transition of clock trigger, data is sent onto the global bitline based on falling transition of clock trigger. A global bitline scheme can be employed that reduces glitches and resulting increases in power consumption.

Abstract: Embodiments disclosed herein include methods and apparatuses for pre-charging bitlines in a static random access memory (SRAM) prior to data access for reducing leakage power. The memory access logic circuit receives a memory access request comprising a data entry address to be accessed in a first data access path of a SRAM data array of the SRAM. The SRAM also includes a pre-charge circuit provided in a second data access path outside the first data access path. The pre-charge circuit is configured to enable pre-charging of the SRAM data array as part of the memory access request to avoid pre-charging bitlines in the SRAM data array during idle periods to reduce leakage power. The pre-charge circuit can enable pre-charging of the SRAM data array prior to data access such that the pre-charge circuit does not add latency to the first data access path.

Abstract: Embodiments disclosed herein include methods and apparatuses for pre-charging bitlines in a static random access memory (SRAM) prior to data access for reducing leakage power. The memory access logic circuit receives a memory access request comprising a data entry address to be accessed in a first data access path of a SRAM data array of the SRAM. The SRAM also includes a pre-charge circuit provided in a second data access path outside the first data access path. The pre-charge circuit is configured to enable pre-charging of the SRAM data array as part of the memory access request to avoid pre-charging bitlines in the SRAM data array during idle periods to reduce leakage power. The pre-charge circuit can enable pre-charging of the SRAM data array prior to data access such that the pre-charge circuit does not add latency to the first data access path.