Patents by Inventor Stephen Frank Meier

Stephen Frank Meier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for distinguishing spatial and thermal defects on perpendicular media
    Patent number: 8369038
    Abstract: Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.
    Type: Grant
    Filed: March 10, 2011
    Date of Patent: February 5, 2013
    Assignee: MRA Tek LLC
    Inventors: Stephen Frank Meier, David H. Ferry, Hassan Jalalian
  • Method and System for Distinguishing Spatial and Thermal Defects on Perpendicular Media
    Publication number: 20120044594
    Abstract: Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.
    Type: Application
    Filed: March 10, 2011
    Publication date: February 23, 2012
    Applicant: MRA TEK, LLC
    Inventors: Stephen Frank Meier, David H. Ferry, Hassan Jalalian
  • Method and system for distinguishing spatial and thermal defects on perpendicular media
    Patent number: 7929235
    Abstract: Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.
    Type: Grant
    Filed: May 7, 2009
    Date of Patent: April 19, 2011
    Assignee: MRA TEK, LLC
    Inventors: Stephen Frank Meier, David H. Ferry, Hassan Jalalian
  • Hard disk inspection method and system
    Patent number: 7630154
    Abstract: A method an apparatus for testing the surface of hard disk platters having vertically oriented magnetic domains is disclosed. According to the method of the present invention, all of the magnetic domains on the surface of the disk to be tested are oriented in the same direction, so that the magnetic field intensity adjacent to the surface is ideally uniform. The surface is then scanned using a read head to identify perturbations in the magnetic field intensity which correlate to surface defects.
    Type: Grant
    Filed: April 4, 2006
    Date of Patent: December 8, 2009
    Assignee: MRA Tek, LLC
    Inventors: Stephen Frank Meier, David H. Ferry
  • Method and System for Distinguishing Spatial and Thermal Defects on Perpendicular Media
    Publication number: 20090213712
    Abstract: Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.
    Type: Application
    Filed: May 7, 2009
    Publication date: August 27, 2009
    Applicant: MRA TEK, LLC
    Inventors: Stephen Frank Meier, David H. Ferry, Hassan Jalalian
  • Method and system for distinguishing spatial and thermal defects on perpendicular media
    Patent number: 7532422
    Abstract: Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.
    Type: Grant
    Filed: October 25, 2006
    Date of Patent: May 12, 2009
    Assignee: MRA TEK, LLC
    Inventors: Stephen Frank Meier, David H. Ferry, Hassan Jalalian
  • METHOD AND SYSTEM FOR DISTINGUISHING SPATIAL AND THERMAL DEFECTS ON PERPENDICULAR MEDIA
    Publication number: 20080100942
    Abstract: Disclosed are a method and system for distinguishing spatial and thermal defects on perpendicular media. The magnetic domains of the perpendicular media are oriented to have a first polarity, scanned using a read head, oriented to have a second polarity and scanned again. The signals from the read head are combined to produce output signals having improved signal to noise ratios from which the locations of spatial and thermal defects can be identified and distinguished.
    Type: Application
    Filed: October 25, 2006
    Publication date: May 1, 2008
    Inventors: Stephen Frank Meier, David H. Ferry, Hassan Jalalian