Patents by Inventor Stephen G. Jordan

Stephen G. Jordan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6529449
    Abstract: A magneto-optical head with a centrally-located solid immersion lens and a coil formed radially about the lens advantageously utilizes an insulating material with a relatively high thermal conductivity for isolating the coil and avoiding heat damage to the head when current is passed through the head during a write operation. First and second coils in first and second coil layers are coupled by a via to form a continuous coil. A combination of a chemical-mechanical contouring operation and the lack of any intervening low thermal conductivity material adjacent the coil effectively produces an insulation layer that is thin but has a contour with a very smooth surface, resulting in a highly compact multiple-level coil.
    Type: Grant
    Filed: July 26, 2000
    Date of Patent: March 4, 2003
    Assignee: Aiwa Co. Ltd.
    Inventors: Stephen G. Jordan, Robert Gray, Arun Malhotra
  • Publication number: 20020137344
    Abstract: Etched substrate produced by chemical-mechanical processing of a patterned substrate which selectively etches patterned portions of the substrate surface, producing deep narrow features with a rapid etch rate. This chemical-mechanical processing is termed chemical-mechanical etching and produces a result that is substantially the opposite of the planarization that is achieved by conventional chemical-mechanical polishing (CMP). A chemical-mechanical polishing (CMP) technique which is widely used for planarization of surfaces is converted for usage as an etching technique, a chemical-mechanical etching (CME) technique, by forming a patterned mask on the substrate surface prior to mechanical polishing. The usage of chemical-mechanical polishing techniques in this manner yields an etching method with properties including a rapid etch rate, a highly controllable etch rate, a highly controllable etch depth, and a greatly selective etch directionality.
    Type: Application
    Filed: May 24, 2002
    Publication date: September 26, 2002
    Inventors: Stephen G. Jordan, G. Robert Gray, Arun Malhotra
  • Patent number: 6417109
    Abstract: Chemical-mechanical processing of a patterned substrate selectively etches patterned portions of the substrate surface, producing deep narrow features with a rapid etch rate. This chemical-mechanical processing is termed chemical-mechanical etching and produces a result that is substantially the opposite of the planarization that is achieved by conventional chemical-mechanical polishing (CMP). A chemical-mechanical polishing (CMP) technique which is widely used for planarization of surfaces is converted for usage as an etching technique, a chemical-mechanical etching (CME) technique, by forming a patterned mask on the substrate surface prior to mechanical polishing. The usage of chemical-mechanical polishing techniques in this manner yields an etching method with properties including a rapid etch rate, a highly controllable etch rate, a highly controllable etch depth, and a greatly selective etch directionality.
    Type: Grant
    Filed: July 26, 2000
    Date of Patent: July 9, 2002
    Assignee: Aiwa Co., Ltd.
    Inventors: Stephen G. Jordan, G. Robert Gray, Arun Malhotra
  • Patent number: 6166879
    Abstract: A method of fabricating thin film magnetic heads on a thin film substrate uses a chemical-mechanical contouring (CMC) step after completion of the fundamental thin film head structure to form a curved surface on the substrate for the individual thin film magnetic heads of a substantial plurality of heads on a thin film substrate. A special CMC process utilizes a soft polishing pad, applying mechanical contouring motion at a slow speed, typically on the order of 1/3 a typical conventional CMP rotational speed, and at a relatively high pressure, typically two to three times a typical conventional CMP applied pressure.
    Type: Grant
    Filed: May 18, 1999
    Date of Patent: December 26, 2000
    Assignee: AIWA Co., Ltd.
    Inventor: Stephen G. Jordan
  • Patent number: 5940956
    Abstract: A method of fabricating thin film magnetic heads on a thin film substrate uses a chemical-mechanical contouring (CMC) step after completion of the fundamental thin film head structure to form a curved surface on the substrate for the individual thin film magnetic heads of a substantial plurality of heads on a thin film substrate. A special CMC process utilizes a soft polishing pad, applying mechanical contouring motion at a slow speed, typically on the order of 1/3a typical conventional CMP rotational speed, and at a relatively high pressure, typically two to three times a typical conventional CMP applied pressure.
    Type: Grant
    Filed: October 31, 1996
    Date of Patent: August 24, 1999
    Assignee: AIWA Co., Ltd.
    Inventor: Stephen G. Jordan
  • Patent number: 5811355
    Abstract: A method of enhanced chemical-mechanical polishing (E-CMP) utilizes an oxygen-rich liquid etchant in an abrasive slurry to form a substantially planar surface on a thin film magnetic head to substantially avoid pole recession. Illumination of the thin film magnetic head with ultraviolet light during E-CMP polishing greatly enhances the effect of the oxygen-rich etchant.
    Type: Grant
    Filed: October 31, 1996
    Date of Patent: September 22, 1998
    Assignee: AIWA Co., Ltd.
    Inventor: Stephen G. Jordan
  • Patent number: 5639323
    Abstract: A method and structure for affixing a component to a structure in an aligned position facilitates fabrication of diminutive assemblies, such as integrated circuits. The component is placed upon a support structure. The component has an alignment marking. The support structure has a viewing aperture and an alignment pattern. The support structure and component are arranged so that the alignment marking and the alignment pattern are visible through the viewing aperture. The alignment marking and the alignment pattern are simultaneously viewed through the viewing aperture and the component is aligned upon the support structure so that the alignment marking of the component is aligned with respect to the alignment pattern of the support structure. The aligned component is bonded to a structural member.
    Type: Grant
    Filed: February 17, 1995
    Date of Patent: June 17, 1997
    Assignee: AIWA Research and Development, Inc.
    Inventor: Stephen G. Jordan