Abstract: Based on a directive in a control file, a processor pre-routes, within a hierarchical integrated circuit design, a signal through one or more levels of design hierarchy between a signal source at a higher level of the design hierarchy and an entity instance at a lower level of the design hierarchy. The processor processes entity instances in the design hierarchy in a bottom-up manner to insert technology-specific structures into the hierarchical integrated circuit design. During the processing, the processor inserts into a particular entity instance of the design hierarchy a technology-specific structure and connects the technology-specific structure to the signal pre-routed to the particular entity instance by the pre-routing.

Abstract: A processor receives, as input, a first hardware description language (HDL) file defining an entity of a modular circuit design. The first HDL file instantiates, by a storage element declaration in a hardware description language, a storage element within the entity. The first HDL file omits a port map for the storage element. Based on the first HDL file, the processor automatically fully elaborates a port map for the storage element. The processor stores, in data storage, a derived second HDL file defining the entity and including the port map.

Abstract: Based on a directive in a control file, a processor pre-routes, within a hierarchical integrated circuit design, a signal through one or more levels of design hierarchy between a signal source at a higher level of the design hierarchy and an entity instance at a lower level of the design hierarchy. The processor processes entity instances in the design hierarchy in a bottom-up manner to insert technology-specific structures into the hierarchical integrated circuit design. During the processing, the processor inserts into a particular entity instance of the design hierarchy a technology-specific structure and connects the technology-specific structure to the signal pre-routed to the particular entity instance by the pre-routing.

Abstract: A processor receives, as input, a first hardware description language (HDL) file defining an entity of a modular circuit design. The first HDL file instantiates, by a storage element declaration in a hardware description language, a storage element within the entity. The first HDL file omits a port map for the storage element. Based on the first HDL file, the processor automatically fully elaborates a port map for the storage element. The processor stores, in data storage, a derived second HDL file defining the entity and including the port map.

Abstract: A first plurality of hardware description language (HDL) files describe a hierarchical integrated circuit design utilizing a simplified HDL syntax that omits specification of logical clock connections for at least some entities in the hierarchical integrated circuit design. The hierarchical integrated circuit design as described by the first plurality of HDL files is processed to automatically add logical clock connections for entities in the hierarchical integrated circuit design for which specification of logical clock connections are omitted in the first plurality of HDL files. Based on the processing, a second plurality of HDL files defining the hierarchical integrated circuit design is generated.

Abstract: A first plurality of hardware description language (HDL) files defines a first scope of design forming only a subset of a larger hierarchical integrated circuit design. Technology-specific structures specific to a physical implementation are incorporated in the first scope of design. A second plurality of HDL files defining a first design entity that is at the first scope of design and that includes the technology-specific structures is generated. A third plurality of HDL files defining a second scope of design for the hierarchical integrated circuit design that is larger than and includes the first scope of design is formed. The third plurality of HDL files is processed to form a representation of the second scope of design. Processing the third plurality of HDL files includes replacing a second design entity in the second scope of design lacking at least some technology-specific structures with the first design entity.

Abstract: A processor receives an expression of design refinement intent with regard to an entity forming a part of a modular circuit design. The entity is defined by a hardware description language (HDL) file, and the expression of design refinement intent identifies an intent region within an implementation of the entity and specifies replacement logic for the region. Based on the expression of design refinement intent, the processor automatically modifies the HDL file by replacing logic within the intent region with the replacement logic. The processor then performs logical synthesis to generate a gate list representation of the modular circuit design as modified.

Abstract: A MEMS component is monitored to determine its status. Sensors are deployed to sense the MEMS component and produce detection signals that are analyzed to determine the MEMS component state. An indicator device alerts a user of the status, particularly if the MEMS component has failed. Additionally, the MEMS component monitoring system may be practiced as a design structure encoded on computer readable storage media as part of a circuit design system.

Abstract: Processing engines (PE's) disposed on the substrate. Each processing engine includes a measurement and storage unit, and a PE controller coupled to each of the processing engines. The processing engines perform self-tests and store the results of the self-tests in the measurement and storage unit. The PE controller reads the results and selects a sub-set of processing engines based on the results and an optimization algorithm.

Abstract: A design structure. The design structure includes: a first set of FETs having a designed first Vt and a second set of FETs having a designed second Vt, the first Vt different from the second Vt; a first monitor circuit containing at least one FET of the first set of FETs and a second monitor circuit containing at least one FET of the second set of FETs; a compare circuit configured to generate a compare signal based on a performance measurement of the first monitor circuit and of the second monitor circuit; a control unit responsive to the compare signal and configured to generate a control signal regulator based on the compare signal; and an adjustable voltage regulator responsive to the control signal and configured to voltage bias wells of FETs of the second set of FETs, the value of the voltage bias applied based on the control signal.

Abstract: A memory sub-system and a method for operating the same. The memory sub-system includes (a) a main memory, (b) an ECC circuit, (c) a hard fail identifier circuit, (d) a repair circuit, (e) a redundant memory, and (f) a threshold setting circuit. The ECC circuit is capable of (i) detecting a first bit fail, (ii) sending an error flag signal to the hard fail identifier circuit, (iii) sending a first location address, a first bit location of the first bit fail, and a repaired data from the first location address to the hard fail identifier circuit. The hard fail identifier circuit is capable of (i) determining the number of times of failure occurring at the first bit fail, (ii) determining whether the number of times of failure is equal to a predetermined threshold value, and (iii) if so, sending a threshold reached signal.

Abstract: A circuit and a method for adjusting the performance of an integrated circuit, the method includes: comprising: (a) measuring the performance of a first monitor circuit having at least one field effect transistor (FET) of a first set of FETs, each FET of the first set of FETs having a designed first threshold voltage; (b) measuring the performance of a second monitor circuit having at least one field effect transistor (FET) of a second set of FETs, each FET of the second set of FETs having a designed second threshold voltage, the second threshold voltage different from the first threshold voltage; and (c) applying a bias voltage to wells of the FETs of the second set of FETs based on comparing a measured performance of the first and second monitor circuits to specified performances of the first and second monitor circuits.

Abstract: A circuit and a method for adjusting the performance of an integrated circuit, the circuit includes: first and second sets of FETs having respective first and second threshold voltages, the first threshold voltage different from the second threshold voltage; a first monitor circuit containing at least one FET of the first set of FETs and a second monitor circuit containing at least one FET of the second set of FETs; a compare circuit adapted to generate a compare signal based on a performance measurement of the first monitor circuit and a performance measurement of the second monitor circuit; and a control unit adapted to generate a control signal to a voltage regulator based on the compare signal, the voltage regulator adapted to supply a bias voltage to wells of FETs of the second set of FETs, the value of the bias voltage based on the control signal.

Abstract: A circuit and a method for adjusting the performance of an integrated circuit, the method includes: comprising: (a) measuring the performance of a first monitor circuit having at least one field effect transistor (FET) of a first set of FETs, each FET of the first set of FETs having a designed first threshold voltage; (b) measuring the performance of a second monitor circuit having at least one field effect transistor (FET) of a second set of FETs, each FET of the second set of FETs having a designed second threshold voltage, the second threshold voltage different from the first threshold voltage; and (c) applying a bias voltage to wells of the FETs of the second set of FETs based on comparing a measured performance of the first and second monitor circuits to specified performances of the first and second monitor circuits.

Abstract: A circuit and a method for adjusting the performance of an integrated circuit, the circuit includes: first and second sets of FETs having respective first and second threshold voltages, the first threshold voltage different from the second threshold voltage; a first monitor circuit containing at least one FET of the first set of FETs and a second monitor circuit containing at least one FET of the second set of FETs; a compare circuit configured to generate a compare signal based on a performance measurement of the first monitor circuit and a performance measurement of the second monitor circuit; and a control unit configured to generate a control signal to a voltage regulator based on the compare signal, the voltage regulator configured to supply a bias voltage to wells of FETs of the second set of FETs, the value of the bias voltage based on the control signal.

Abstract: A memory sub-system and a method for operating the same. The memory sub-system includes (a) a main memory, (b) an ECC circuit, (c) a hard fail identifier circuit, (d) a repair circuit, (e) a redundant memory, and (f) a threshold setting circuit. The ECC circuit is capable of (i) detecting a first bit fail, (ii) sending an error flag signal to the hard fail identifier circuit, (iii) sending a first location address, a first bit location of the first bit fail, and a repaired data from the first location address to the hard fail identifier circuit. The hard fail identifier circuit is capable of (i) determining the number of times of failure occurring at the first bit fail, (ii) determining whether the number of times of failure is equal to a predetermined threshold value, and (iii) if so, sending a threshold reached signal.

Abstract: A memory sub-system and a method for operating the same. The memory sub-system includes (a) a main memory, (b) an ECC circuit, (c) a hard fail identifier circuit, (d) a repair circuit, (e) a redundant memory, and (f) a threshold setting circuit. The ECC circuit is capable of (i) detecting a first bit fail, (ii) sending an error flag signal to the hard fail identifier circuit, (iii) sending a first location address, a first bit location of the first bit fail, and a repaired data from the first location address to the hard fail identifier circuit. The hard fail identifier circuit is capable of (i) determining the number of times of failure occurring at the first bit fail, (ii) determining whether the number of times of failure is equal to a predetermined threshold value, and (iii) if so, sending a threshold reached signal.

Abstract: A circuit and a method for adjusting the performance of an integrated circuit, the circuit includes: first and second sets of FETs having respective first and second threshold voltages, the first threshold voltage different from the second threshold voltage; a first monitor circuit containing at least one FET of the first set of FETs and a second monitor circuit containing at least one FET of the second set of FETs; a compare circuit adapted to generate a compare signal based on a performance measurement of the first monitor circuit and a performance measurement of the second monitor circuit; and a control unit adapted to generate a control signal to a voltage regulator based on the compare signal, the voltage regulator adapted to supply a bias voltage to wells of FETs of the second set of FETs, the value of the bias voltage based on the control signal.

Abstract: In connection with a logic circuit including a mask generator for determining a value for a so-called "sticky bit" in a binary number to be truncated and rounded, an intermediate signal is taken from the mask generator and an Exclusive-OR function applied to adjacent bits to generate a second mask containing or adjacent to a transition between the portion of the number to be dropped and the portion to be retained in the truncated number. The second mask is applied to different overlapping groups of bits in a portion of the number which contains the least significant bit and the guard bit as determined from the number of bits to be dropped, for example, by shifting out from a shifter, as the number is truncated and rounded to extract a specific bit in each group of bits. By extracting such specific bits using a mask, the extraction process is removed from the critical path of the processor which includes the shifter and the extraction process can proceed in parallel with the shifting process.

Abstract: An effective address limit checker reduces the logic delay in the limit checking path. The address limit checker comprises an effective address (EA) adder and limit check logic. The EA adder includes a first carry save adder receiving a displacement, an index and a base address for calculating an effective address, and a second carry select adder receiving partial sum and carry outputs of said first adder for calculating an effective address carry out. The outputs of the EA adder are input to the limit checking logic together with an address limit value and an addressability mode field. The limit checking logic includes a third adder for calculating first partial limit information based on the first adder results and the limit value, and a fourth adder for calculating second partial limit information based on the first adder results and the limit value and conditioned carry out values of the third adder. The third and fourth adders are each composed of a carry save adder and a carry select adder.