Patents by Inventor Stephen Head

Stephen Head has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9793178
    Abstract: The capacity to measure nanoscale features rapidly and accurately is of central importance for the monitoring of manufacturing processes in the production of computer integrated circuits. It is known that far-field scattered light requires a priori sample information in order to reconstruct nanoscale information such as is required in semiconductor metrology. Parameters of interest include, for example, trench depth, duty cycle, wall angle and oxide layer thickness. We describe a scatterometry apparatus and method that uses unconventional polarization states in the pupil of a high NA objective lens, and refer to this as focused beam scatterometry, in which the illumination consists of a focused field with a suitably tailored, spatially-varying polarization distribution. We describe how four or more parameters can be measured and distinguished with an accuracy consistent with the needs laid out in the semiconductor roadmap.
    Type: Grant
    Filed: August 24, 2015
    Date of Patent: October 17, 2017
    Assignee: University of Rochester
    Inventors: Miguel A. Alonso, Stephen Head, Michael Theisen, Thomas Brown
  • Publication number: 20160061723
    Abstract: The capacity to measure nanoscale features rapidly and accurately is of central importance for the monitoring of manufacturing processes in the production of computer integrated circuits. It is known that far-field scattered light requires a priori sample information in order to reconstruct nanoscale information such as is required in semiconductor metrology. Parameters of interest include, for example, trench depth, duty cycle, wall angle and oxide layer thickness. We describe a scatterometry apparatus and method that uses unconventional polarization states in the pupil of a high NA objective lens, and refer to this as focused beam scatterometry, in which the illumination consists of a focused field with a suitably tailored, spatially-varying polarization distribution. We describe how four or more parameters can be measured and distinguished with an accuracy consistent with the needs laid out in the semiconductor roadmap.
    Type: Application
    Filed: August 24, 2015
    Publication date: March 3, 2016
    Applicant: UNIVERSITY OF ROCHESTER
    Inventors: Miguel A. Alonso, Stephen Head, Michael Theisen, Thomas Brown
  • Publication number: 20020094525
    Abstract: Molecules and methods suitable for identifying multiple polymorphic sites in the genome of a plant or animal. The identification of such sites is useful in determining identity, ancestry, predisposition to genetic disease, the presence or absence of a desired trait, etc.
    Type: Application
    Filed: December 3, 1999
    Publication date: July 18, 2002
    Inventors: TINA MCINTOSH, STEPHEN HEAD, PHILIP GOELET, MICHAEL T. BOYCE-JACINO
  • Patent number: PP19949
    Abstract: A new and distinct cultivar of Rosmarinus named ‘GOLD DUST’ that is characterized by dense upright habit, deep-blue flowers, and thick variegated leaves with dark-green centers and broad gold margins. In combination these traits set ‘GOLD DUST’ apart from all other existing varieties of Rosmarinus known to the inventor.
    Type: Grant
    Filed: May 12, 2008
    Date of Patent: April 21, 2009
    Inventors: Stephen Head, Julie Head