Patents by Inventor Stephen J. Bauer

Stephen J. Bauer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for measuring material degradation
    Patent number: 12196645
    Abstract: Systems and methods that measure material deformation by measuring a tracer gas that has been added to or is present in an engineered material that is subsequently released from the material, measured, and correlated to a change in a property of the material upon a stress/strain being applied to the engineered material.
    Type: Grant
    Filed: December 20, 2018
    Date of Patent: January 14, 2025
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Stephen J. Bauer, William Payton Gardner
  • Tattletale ion-implanted nanoparticles
    Patent number: 10514361
    Abstract: Ion-doped metal or ceramic nanoparticles can be added into, for example, a component that upon exposure to an environmental stimulus, will release the ion and ‘tattle’ on any impending destruction.
    Type: Grant
    Filed: August 21, 2018
    Date of Patent: December 24, 2019
    Assignees: National Technology & Engineering Solutions of Sandia, LLC, STC.UNM
    Inventors: Timothy J. Boyle, Khalid Mikhiel Hattar, Fernando Henry Garzon, Stephen J. Bauer
  • Tattletale ion-implanted nanoparticles
    Publication number: 20190064111
    Abstract: Ion-doped metal or ceramic nanoparticles can be added into, for example, a component that upon exposure to an environmental stimulus, will release the ion and ‘tattle’ on any impending destruction.
    Type: Application
    Filed: August 21, 2018
    Publication date: February 28, 2019
    Inventors: Timothy J. Boyle, Khalid Mikhiel Hattar, Fernando Henry Garzon, Stephen J. Bauer
  • Electrofracturing test system and method of determining material characteristics of electrofractured material samples
    Patent number: 9719908
    Abstract: A device for electrofracturing a material sample and analyzing the material sample is disclosed. The device simulates an in situ electrofracturing environment so as to obtain electrofractured material characteristics representative of field applications while allowing permeability testing of the fractured sample under in situ conditions.
    Type: Grant
    Filed: February 18, 2015
    Date of Patent: August 1, 2017
    Assignee: Sandia Corporation
    Inventors: Stephen J. Bauer, Steven F. Glover, Tom Pfeifle, Jiann-Cherng Su, Kenneth Martin Williamson, Scott Thomas Broome, William Payton Gardner, Gary Pena