Abstract: Tracking cells are used in a memory system to improve the read process. The tracking cells can provide an indication of the quality of the data and can be used as part of a data recovery operation if there is an error. The tracking cells provide a means to adjust the read parameters to optimum levels in order to reflect the current conditions of the memory system. Read operations are performed on the tracking cells, where threshold voltages of physical states of the tracking cells are further apart than threshold voltages of physical states of non-tracking cells. Based on the read operations, an extent to which the tracking cells are errored is determined.

Abstract: Tracking cells are used in a memory system to improve the read process. The tracking cells can provide an indication of the quality of the data and can be used as part of a data recovery operation if there is an error. The tracking cells provide a means to adjust the read parameters to optimum levels in order to reflect the current conditions of the memory system. Read operations are performed on the tracking cells, where threshold voltages of physical states of the tracking cells are further apart than threshold voltages of physical states of non-tracking cells. Based on the read operations, an extent to which the tracking cells are errored is determined.

Abstract: Tracking cells are used in a memory system to improve the read process. The tracking cells can provide an indication of the quality of the data and can be used as part of a data recovery operation if there is an error. The tracking cells provide a means to adjust the read parameters to optimum levels in order to reflect the current conditions of the memory system. Additionally, some memory systems that use multi-state memory cells will apply rotation data schemes to minimize wear. The rotation scheme can be encoded in the tracking cells based on the states of multiple tracking cells, which is decoded upon reading.

Abstract: Tracking cells are used in a memory system to improve the read process. The tracking cells can provide an indication of the quality of the data and can be used as part of a data recovery operation if there is an error. The tracking cells provide a means to adjust the read parameters to optimum levels in order to reflect the current conditions of the memory system. Additionally, some memory systems that use multi-state memory cells will apply rotation data schemes to minimize wear. The rotation scheme can be encoded in the tracking cells based on the states of multiple tracking cells, which is decoded upon reading.

Abstract: Tracking cells are used in a memory system to improve the read process. The tracking cells can provide an indication of the quality of the data and can be used as part of a data recovery operation if there is an error. The tracking cells provide a means to adjust the read parameters to optimum levels in order to reflect the current conditions of the memory system. Additionally, some memory systems that use multi-state memory cells will apply rotation data schemes to minimize wear. The rotation scheme can be encoded in the tracking cells based on the states of multiple tracking cells, which is decoded upon reading.

Abstract: Tracking cells are used in a memory system to improve the read process. The tracking cells can provide an indication of the quality of the data and can be used as part of a data recovery operation if there is an error. The tracking cells provide a means to adjust the read parameters to optimum levels in order to reflect the current conditions of the memory system. Additionally, some memory systems that use multi-state memory cells will apply rotation data schemes to minimize wear. The rotation scheme can be encoded in the tracking cells based on the states of multiple tracking cells, which is decoded upon reading.

Abstract: A portion of data stored in a non-volatile memory may be found to be corrupted when it is read. Where parity data is generated from portions of data and the parity data is stored with the portions of data, the corrupted data may be reconstructed from the parity data and uncorrupted portions of data.

Abstract: A portion of data stored in a non-volatile memory may be found to be corrupted when it is read. Where parity data is generated from portions of data and parity data is stored with the portions of data, the corrupted data may be reconstructed from the parity data and uncorrupted portions of data.

Abstract: Methods and apparatus for transforming data into a format which may be efficiently stored in a non-volatile memory are disclosed. According to one aspect of the present invention, a method for storing information of a first data format in a memory system includes generating statistics associated with the first data format, and transforming the information from the first data format to a second data format using the statistics. Once the information is transformed into the second data format, the information is stored into a memory. Storing the information in the second data format in the memory includes storing an identifier that identifies a transformation used to transform the information to the second data format. In one embodiment, costs associated with storing the information in the second data format are less than or equal to costs associated with storing the information in the first data format.

Abstract: Tracking cells are used in a memory system to improve the read process. The tracking cells can provide an indication of the quality of the data and can be used as part of a data recovery operation if there is an error. The tracking cells provide a means to adjust the read parameters to optimum levels in order to reflect the current conditions of the memory system. Additionally, some memory systems that use multi-state memory cells will apply rotation data schemes to minimize wear. The rotation scheme can be encoded in the tracking cells based on the states of multiple tracking cells, which is decoded upon reading.

Abstract: Methods and apparatus for transforming data into a format which may be efficiently stored in a non-volatile memory are disclosed. According to one aspect of the present invention, a method for storing information of a first data format in a memory system includes generating statistics associated with the first data format, and transforming the information from the first data format to a second data format using the statistics. Once the information is transformed into the second data format, the information is stored into a memory. Storing the information in the second data format in the memory includes storing an identifier that identifies a transformation used to transform the information to the second data format. In one embodiment, costs associated with storing the information in the second data format are less than or equal to costs associated with storing the information in the first data format.

Abstract: Tracking cells are used in a memory system to improve the read process. The tracking cells can provide an indication of the quality of the data and can be used as part of a data recovery operation if there is an error. The tracking cells provide a means to adjust the read parameters to optimum levels in order to reflect the current conditions of the memory system. Additionally, some memory systems that use multi-state memory cells will apply rotation data schemes to minimize wear. The rotation scheme can be encoded in the tracking cells based on the states of multiple tracking cells, which is decoded upon reading.

Abstract: An arm and safety switch for ammunition rounds, such as a 120 mm multipurpose tank round, senses launch detonation pressure. The switch will not arm the projectile if the pressure detected is less than or equal to a first predetermined pressure characteristic of a misfire, and will arm if the detected pressure is greater than or equal to a second predetermined pressure characteristic of a successful launch. An efficient, reliable method and mechanism operate to discriminate between successful and unsuccessful projectile launch and use that information to arm or not arm the projectile.

Abstract: Methods and apparatus for transforming data into a format which may be efficiently stored in a non-volatile memory are disclosed. According to one aspect of the present invention, a method for storing information of a first data format in a memory system includes generating statistics associated with the first data format, and transforming the information from the first data format to a second data format using the statistics. Once the information is transformed into the second data format, the information is stored into a memory. Storing the information in the second data format in the memory includes storing an identifier that identifies a transformation used to transform the information to the second data format. In one embodiment, costs associated with storing the information in the second data format are less than or equal to costs associated with storing the information in the first data format.

Abstract: A memory system having a two dimensional array of EEPROM or Flash EEPROM cells is addressable by rows and columns. A word line is connected to the control gates of all the cells in each row, an erase line is connected to all the erase gates of each sector of cells, and a pair of bit lines are connected respectively to all the sources and drains of each column of cells. The memory system incorporates a word line current detector and an erase line current detector in addition to the usual bit line current detectors. The leakage current of each of the lines are measured after predetermined memory events such as program or erase operations. When a defective row or column is detected, it is electrically isolated from other columns by programming and is mapped out and replaced. Data recovery schemes include reading a defective column by a switched-memory-source-drain technique.

Abstract: In a mixed data encoding scheme for programming data into a flash sector of a flash EEPROM system, a method for determining which data encoding scheme has been used for programming the retrieved data involves examining whether an error correction code of the data indicates an error.

Abstract: A memory system having a two dimensional array of EEPROM or Flash EEPROM cells is addressable by rows and columns. A word line is connected to the control gates of all the cells in each row, an erase line is connected to all the erase gates of each sector of cells, and a pair of bit lines are connected respectively to all the sources and drains of each column of cells. The memory system incorporates a word line current detector and an erase line current detector in addition to the usual bit line current detectors. The leakage current of each of the lines are measured after predetermined memory events such as program or erase operations. When a defective row or column is detected, it is electrically isolated from other columns by programming and is mapped out and replaced. Data recovery schemes include reading a defective column by a switched-memory-source-drain technique.

Abstract: Various optimizing techniques are used for erasing semiconductor electrically erasable programmable read only memories (EEPROM). An erase algorithm accomplishes erasing of a group of memory cells by application of incremental erase pulses. Techniques include a 2-phase verification process interleaving between pulse applications; special handling of a sample of cells within each erasable unit group; defects handling; and adaptive initial erasing voltages. A streamlined write operation on a flash sector of the EEPROM is implemented by employing the optimized erase in an efficient manner. The write operation includes an initial quick erase of the sector followed by programming of data and verification. Only on those infrequent occasions when a failure occurs as manifested during program verification that the optimized erase will need be evoked.

Abstract: Various optimizing techniques are used for erasing semiconductor electrically erasable programmable read only memories (EEPROM), An erase algorithm accomplishes erasing of a group of memory cells by application of incremental erase pulses, Techniques include a 2-phase verification process interleaving between pulse applications; special handling of a sample of cells within each erasable unit group; defects handling; adaptive initial erasing voltages; and single- and hybrid-phase algorithms with sector to sector estimation of erase characteristics by table lookup. Techniques are also employed for controlling the uniformity of program/erase cycling of cells in each erasable unit group, Defects handling includes an adaptive data encoding scheme.

Abstract: Various optimizing techniques are used for erasing semiconductor electrically erasable programmable read only memories (EEPROM). An erase algorithm accomplishes erasing of a group of memory cells by application of incremental erase pulses. Techniques include a 2-phase verification process interleaving between pulse applications; special handling of a sample of cells within each erasable unit group; defects handling; adaptive initial erasing voltages; and single-and hybrid-phase algorithms with sector to sector estimation of erase characteristics by table lookup. Techniques are also employed for controlling the uniformity of program/erase cycling of cells in each erasable unit group. Defects handling includes an adaptive data encoding scheme.