Patents by Inventor Stephen J. Hlotyak

Stephen J. Hlotyak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Site loops
    Patent number: 7254508
    Abstract: A method for use with a test system having sites that hold devices under test (DUTs) includes executing a first site loop to iterate through the sites, where the first site loop includes an instruction to program hardware associated with at least one of the sites, and executing a second site loop to process data received from the DUTs, where the second site loop and the first site loop have a same syntax.
    Type: Grant
    Filed: September 20, 2005
    Date of Patent: August 7, 2007
    Assignee: Teradyne, Inc.
    Inventor: Stephen J. Hlotyak
  • Site-aware objects
    Patent number: 7253607
    Abstract: A method for use with automatic test equipment (ATE) having sites, each which accommodates a device under test (DUT), includes defining an object for use with the plural sites, where the object is to contain data associated with at least some of the plural sites, and where the object determines which sites are active. The method also includes using the object during testing of DUTs by the ATE.
    Type: Grant
    Filed: July 29, 2005
    Date of Patent: August 7, 2007
    Assignee: Teradyne, Inc.
    Inventors: Stephen J. Hlotyak, Randall B. Stimson, Daniel P. Thornton
  • Automatic test system with easily modified software
    Patent number: 7171587
    Abstract: An automatic test system, such as might be used to test semiconductor devices as part of their manufacture. The test system uses instruments to generate and measure test signals. The automatic test system has a hardware and software architecture that allows instruments to be added to the test system after it is manufactured. The software is segregated into instrument specific and instrument independent software. Predefined interfaces to the software components allow for easy integration of instruments into the test system and also easy reuse of the software as the physical implementation of the test system or the instruments changes from tester to tester in a product family.
    Type: Grant
    Filed: June 12, 2003
    Date of Patent: January 30, 2007
    Assignee: Teradyne, Inc.
    Inventors: Stephen J. Hlotyak, Alan L. Blitz, Randall B. Stimson
  • Automatic test system with easily modified software
    Publication number: 20040215361
    Abstract: An automatic test system, such as might be used to test semiconductor devices as part of their manufacture. The test system uses instruments to generate and measure test signals. The automatic test system has a hardware and software architecture that allows instruments to be added to the test system after it is manufactured. The software is segregated into instrument specific and instrument independent software. Predefined interfaces to the software components allow for easy integration of instruments into the test system and also easy reuse of the software as the physical implementation of the test system or the instruments changes from tester to tester in a product family.
    Type: Application
    Filed: June 12, 2003
    Publication date: October 28, 2004
    Inventors: Stephen J. Hlotyak, Alan L. Blitz, Randall B. Stimson