Patents by Inventor Stephen J. Rieks

Stephen J. Rieks has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods for detecting inhomogeneities, specifically, striae, infused silica glasses
    Patent number: 5764345
    Abstract: A process for detecting inhomogeneities, specifically, striae in a sample of fused silica glass is provided which includes the steps of: preparing a digitized phase plot for the sample using an interferometer which produces a beam of light which passes through the sample; applying a high pass filter to the phase plot to remove the effects of the sample's bulk properties; applying a statistical filter to the high pass filtered data to remove outlying data points; and column averaging the statistically filtered data. If present, striae can be readily detected in the column averaged, statistically filtered data.
    Type: Grant
    Filed: September 11, 1996
    Date of Patent: June 9, 1998
    Assignee: Corning Incorporated
    Inventors: David R. Fladd, Stephen J. Rieks