Abstract: Disclosed herein are system, method, and computer program product embodiments for creating cyber situational understanding in an operational environment. An embodiment operates by normalizing streaming cyber information for a plurality of cyberspace entities and generating cyber-graphs based on relationships between two or more of the plurality of cyberspace entities. A cyber-threat inquiry of the cyber-graphs returns potential cyber-threats that are subsequently visualized as an overlay on a corresponding operational environment.

Abstract: Disclosed are limb prostheses for use when normal use of the lower leg is temporarily or permanently lost due to lower leg injury or disease, including below-knee amputation. Disclosed prostheses provide full body weight support and allow a wearer to maintain the use of the hands and arms during ambulation. In addition, a wearer can maintain use of their own knee to flex and extend during ambulation, thereby better controlling the prosthesis during motion and providing a more normal gait as compared to previously known devices. In the event of permanent loss of the lower leg due to below-knee amputation, the disclosed prosthesis provides an alternative to socket-type prosthetic devices.

Abstract: The present disclosure describes an apparatus and a system for generating electrical signals for a loudspeaker. The loudspeaker may include one or more piezoelectric actuators configured to deflect a diaphragm of the loudspeaker in response to an input signal. The apparatus may be configured to receive the input signal and to drive the piezoelectric actuators to deflect the diaphragm based on the received input signal.

Abstract: Audio processing methods and apparatus are provided for at least partially compensating for the Fletcher-Munson effect. An audio processor includes a variable filter receiving an input signal and providing a filtered output signal, the variable filter having a fixed cutoff frequency and a quality factor that is controllable in response to a control signal, and a control circuit configured to detect a signal level representative of input signal level in a selected band and to generate the control signal in response to the detected signal level. The control circuit may include a low-pass band select filter and a detector for detecting a signal level in the band selected by the low-pass filter and for generating the control signal.

Abstract: Methods and computer program products are provided for analyzing a crystalline structure, such as a wafer or an epitaxial layer in more detail, including the portion of the crystalline structure proximate the edge. The methods and computer program products of one aspect determine the average thickness and the normalized profile of a crystalline structure with enhanced detail. Additionally, the method and computer program product of another aspect represent the profile proximate the edge of the crystalline structure with a pair of lines that are selected to permit the profile of the crystalline structure proximate the edge of the crystalline structure to be characterized in more detail. Further, the method of yet another aspect permits the average edge profile for a plurality of crystalline structure to be defined.

Abstract: Methods and computer program products are provided for analyzing a crystalline structure, such as a wafer or an epitaxial layer in more detail, including the portion of the crystalline structure proximate the edge. The methods and computer program products of one aspect determine the average thickness and the normalized profile of a crystalline structure with enhanced detail. Additionally, the method and computer program product of another aspect represent the profile proximate the edge of the crystalline structure with a pair of lines that are selected to permit the profile of the crystalline structure proximate the edge of the crystalline structure to be characterized in more detail. Further, the method of yet another aspect permits the average edge profile for a plurality of crystalline structure to be defined.

Abstract: A system and method for sorting semiconductor substrates based on substrate thickness. The invention includes weighing each semiconductor substrate to be sorted, and then calculating the thickness of each substrate from its mass, area and density. The system may be configured to automatically sort the substrates according to the weight-based thickness calculations.