Abstract: A container (10) for holding a primary sharp object, the container (10) including a cushioning layer (20), the cushioning layer (20) having a pre-formed indentation (25), the indentation (25) being configured to receive and hold the primary sharp object therein.

Abstract: A communication system includes a plurality of time division multiplexed (TDM) public switched telephone network (PSTN) trunks, a Signal Control Point (SCP), a Softswitch, and an Internet telephony call controller. The SCP a plurality of phone numbers for time division multiplexed TDM PSTN lines with an Internet telephony feature group that has Internet telephony feature handling. The SCP routes phone calls that are directed to phone numbers in the Internet telephony feature group through at least one dedicated trunk of the PSTN to the Softswitch. The Softswitch routes phone calls that it receives on the dedicated trunk to the Internet telephony call controller for Internet telephony feature handling.

Abstract: Embodiments of the present invention provide a mobile location-based loyalty program. The frequent-driver program (FDP) and/or frequent-driving miles is a loyalty program (or any other name that might imply this type of mobile location based loyalty program) that may be offered by many business entities, referred to as ‘MERCHANTS’ and where customers, referred to as ‘USERS’ earn the reward points as they travel (The primary modes of travel include driving, walking, running or biking) through and/or stays within a reward region established by a ‘MERCHANT’. A reward region (overlay) pertains to a geographical area or areas. When a user travels through a reward region and/or remains within a reward region, the user has the opportunity to earn points that are redeemable with the merchant. Additionally, merchants have the opportunity to reach people that pass by and stay within the merchant reward regions (locations).

Abstract: Various embodiments are directed to imaging systems and methods for generating an image of a sub-surface feature of an object through a surface of the object. An illumination array may comprise a plurality of illumination sources positioned around the sub-surface feature of the object. An imaging device may comprise an objective. A computer system may be in communication with the illumination array. The computer system may be programmed to calculate an optimized illumination pattern of the plurality of illumination sources for imaging the sub-surface feature; activate the optimized illumination pattern; and instruct the imaging device to capture an image of the sub-surface feature with the imaging device based on reflected illumination from the optimized illumination pattern.

Abstract: Various embodiments are directed to imaging systems and methods for generating an image of a sub-surface feature of an object through a surface of the object. An illumination array may comprise a plurality of illumination sources positioned around the sub-surface feature of the object. An imaging device may comprise an objective. A computer system may be in communication with the illumination array. The computer system may be programmed to calculate an optimized illumination pattern of the plurality of illumination sources for imaging the sub-surface feature; activate the optimized illumination pattern; and instruct the imaging device to capture an image of the sub-surface feature with the imaging device based on reflected illumination from the optimized illumination pattern.

Abstract: An illumination source may be directed towards a surface of an object comprising subsurface features, wherein the illumination from the source is directed at a first angle relative to the normal of the surface. The object may have a portion between the subsurface features and the surface, the portion having an index of refraction that is greater than the index of refraction of a surrounding medium that surrounds the object. An imaging device may be placed with an objective lens. The first angle may be larger than an acceptance angle of the objective lens. In some embodiments, multiple illumination beams may be generated by one or more illumination sources. The beams may be rotated relative to one another about the normal of the surface. Also, in some embodiments, multiple images may be taken with the objective of the imaging device at different positions rotated off of the normal. The multiple images may be combined to generate a composite image.

Abstract: Various embodiments are directed to systems and methods for imaging subsurface features of a semiconductor object comprising a first region having a first doping property and a second region having a second doping property. The semiconductor object may comprise subsurface features and material between a surface of the semiconductor object and the subsurface features. The material may have an index of refraction that is greater than an index of refraction of a surrounding medium in contact with the surface of the semiconductor object. For example, a system may comprise an imaging device comprising an objective. The imaging device may be sensitive to a first wavelength. The system may also comprise an illumination source to emit illumination substantially at the first wavelength. The illumination may be directed towards the surface of the semiconductor object at a first angle relative to a normal of the surface. The first angle is greater than an acceptance angle of the objective of the imaging device.

Abstract: Various embodiments are directed to systems and methods of imaging subsurface features of objects. An illumination source may be directed towards a surface of an object comprising subsurface features at a first angle relative to the normal of the surface. The object may have a portion between the subsurface features and the surface that has an index of refraction that is greater than the index of refraction of a surrounding medium. An imaging device may be placed with an objective lens oriented substantially normal to the surface. The first angle may be larger than an acceptance angle of the objective lens.

Abstract: Various embodiments are directed to systems and methods of imaging subsurface features of objects. An illumination source may be directed towards a surface of an object comprising subsurface features at a first angle relative to the normal of the surface. The object may have a portion between the subsurface features and the surface that has an index of refraction that is greater than the index of refraction of a surrounding medium. An imaging device may be placed with an objective lens oriented substantially normal to the surface. The first angle may be larger than an acceptance angle of the objective lens.

Abstract: Various embodiments are directed to systems and methods of imaging subsurface features of objects. An illumination source may be directed towards a surface of an object comprising subsurface features at a first angle relative to the normal of the surface. The object may have a portion between the subsurface features and the surface that has an index of refraction that is greater than the index of refraction of a surrounding medium. An imaging device may be placed with an objective lens oriented substantially normal to the surface. The first angle may be larger than an acceptance angle of the objective lens.

Abstract: Various embodiments are directed to systems and methods for imaging subsurface features of a semiconductor object comprising a first region having a first doping property and a second region having a second doping property. The semiconductor object may comprise subsurface features and material between a surface of the semiconductor object and the subsurface features. The material may have an index of refraction that is greater than an index of refraction of a surrounding medium in contact with the surface of the semiconductor object. For example, a system may comprise an imaging device comprising an objective. The imaging device may be sensitive to a first wavelength. The system may also comprise an illumination source to emit illumination substantially at the first wavelength. The illumination may be directed towards the surface of the semiconductor object at a first angle relative to a normal of the surface. The first angle is greater than an acceptance angle of the objective of the imaging device.

Abstract: An illumination source may be directed towards a surface of an object comprising subsurface features, wherein the illumination from the source is directed at a first angle relative to the normal of the surface. The object may have a portion between the subsurface features and the surface, the portion having an index of refraction that is greater than the index of refraction of a surrounding medium that surrounds the object. An imaging device may be placed with an objective lens. The first angle may be larger than an acceptance angle of the objective lens. In some embodiments, multiple illumination beams may be generated by one or more illumination sources. The beams may be rotated relative to one another about the normal of the surface. Also, in some embodiments, multiple images may be taken with the objective of the imaging device at different positions rotated off of the normal. The multiple images may be combined to generate a composite image.

Abstract: Various embodiments are directed to systems and methods of imaging subsurface features of objects. An illumination source may be directed towards a surface of an object comprising subsurface features at a first angle relative to the normal of the surface. The object may have a portion between the subsurface features and the surface that has an index of refraction that is greater than the index of refraction of a surrounding medium. An imaging device may be placed with an objective lens oriented substantially normal to the surface. The first angle may be larger than an acceptance angle of the objective lens.

Abstract: An apparatus, system, and method are provided for updating a code image. The apparatus, system, and method include a loader for loading a new code image into a temporary memory location separate from the memory location occupied by the old code image. A conversion module of the new code image executes and selectively reconciles incompatibilities between the old code image and the new code image. In one aspect, once incompatibilities are reconciled, a copy module copies the new code image into the memory space occupied by the old code image.

Abstract: A communication system includes a plurality of time division multiplexed (TDM) public switched telephone network (PSTN) trunks, a Signal Control Point (SCP), a Softswitch, and an Internet telephony call controller. The SCP a plurality of phone numbers for time division multiplexed TDM PSTN lines with an Internet telephony feature group that has Internet telephony feature handling. The SCP routes phone calls that are directed to phone numbers in the Internet telephony feature group through at least one dedicated trunk of the PSTN to the Softswitch. The Softswitch routes phone calls that it receives on the dedicated trunk to the Internet telephony call controller for Internet telephony feature handling.

Abstract: The double loop connector shown in the drawing guides AERIAL PLANES and it is this double loop connector allows the AERIAL PLANE to float up or down the antennae without binding. There are currently antennae balls in the market already, (Jack in the Box) but the AERIAL PLANE is the first antennae that actualy floats with the air current. In fact on windy days people can observe AERIAL PLANES rising and falling on parked cars. AERIAL PLANES can give car owners a new toy that with a small arrestor clip on the antennae will prevent distraction to the driver.