Patents by Inventor Stephen Maximilian Altmann

Stephen Maximilian Altmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multiple local probe measuring device and method
    Patent number: 6798226
    Abstract: The invention provides a probe measuring device for effecting local measurements referring to a sample, having a first probe and a second probe, a measurement condition adjustment arrangement adapted to commonly adjust a first measurement condition of the first probe with respect to a sample or a reference surface and a second measurement condition of the second probe with respect to a sample or a reference surface, a detection arrangement having a first detection arrangement associated with the first probe adapted to independently detect first measurement data referring to local measurements effected by the first probe and a second detection arrangement associated with the second probe adapted to independently detect second measurement data referring to local measurements effected by the second probe. Also provided are methods for effecting local measurements and local manipulations using multiple probes.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: September 28, 2004
    Assignee: Europäisches Laboratorium für Molekularbiologie (EMBL)
    Inventors: Stephen Maximilian Altmann, Johann Karl Heinrich Hörber