Abstract: A method for inspecting absorbent articles is provided. The inspection is performed using an inspection algorithm generated with a convolutional neural network having convolutional neural network parameters. The convolutional neural network parameters are generated by a training algorithm. Based on the inspection, characteristics of the absorbent articles, such as defects, can be identified. Absorbent articles having identified characteristics can be rejected, or other actions can be taken.

Abstract: The methods herein utilize polarized light for detecting through holes in substrates. A light source directs light through a first polarization filter having a first polarization axis, wherein polarized light travels from the first polarization filter and toward a substrate. The orientation of the polarized light is changed while traveling through substrate material, and is scattered. However, polarized light traveling through a hole in the substrate remains unscattered. A second polarization filter receives unscattered light and scattered light traveling away from the substrate. The second polarization filter includes a second polarization axis angularly offset from and not parallel with the first polarization axis. As such, the second polarization filter blocks the advancement of unscattered light while the scattered light is not blocked by the second polarization filter. The hole is detected based on an absence of unscattered light surrounded by light traveling from the second polarization filter.

Abstract: A method for inspecting absorbent articles is provided. The inspection is performed using an inspection algorithm generated with a convolutional neural network having convolutional neural network parameters. The convolutional neural network parameters are generated by a training algorithm. Based on the inspection, characteristics of the absorbent articles, such as defects, can be identified. Absorbent articles having identified characteristics can be rejected, or other actions can be taken.

Abstract: A method for inspecting absorbent articles is provided. The inspection is performed using an inspection algorithm generated with a convolutional neural network having convolutional neural network parameters. The convolutional neural network parameters are generated by a training algorithm. Based on the inspection, characteristics of the absorbent articles, such as defects, can be identified. Absorbent articles having identified characteristics can be rejected, or other actions can be taken.

Abstract: The present disclosure relates to methods and apparatuses for sensing distortions in patterns of reflected light to create profiles representing surface topographies of absorbent structures during the manufacture of absorbent articles. Inspection systems may include sensors arranged adjacent an advancing absorbent structure on a converting line. In turn, a controller may monitor and affect various operations on the converting line. The inspection systems herein may also include a radiation source that illuminates a surface of an absorbent structure with a predetermined pattern of light extending in the cross direction CD. The sensor senses distortions in patterns of light reflected from the illuminated surface of the absorbent structure and triangulates changes in elevation of the illuminated surface of the absorbent structure relative to the sensor.

Abstract: The present disclosure relates to methods and apparatuses for monitoring substrates advancing along a converting apparatus in a machine direction. The apparatus may include an analyzer connected with a line scan camera through a communication network. The analyzer may be configured as a field programmable gate array, an application specific integrated circuit, or a graphical processing unit. In addition, the line scan camera may include a linear array of pixel data and define a linear field of view, wherein the line scan camera is arranged such that the linear field of view extends in the machine direction. The apparatus may further include an illumination source that illuminates the linear field of view. In operation, the substrate is advanced in the machine direction such that a portion of the substrate advances through the linear field of view. In turn, the apparatus may be configured to perform various monitoring and/or control functions.

Abstract: The methods herein utilize polarized light for detecting through holes in substrates. A light source directs light through a first polarization filter having a first polarization axis, wherein polarized light travels from the first polarization filter and toward a substrate. The orientation of the polarized light is changed while traveling through substrate material, and is scattered. However, polarized light traveling through a hole in the substrate remains unscattered. A second polarization filter receives unscattered light and scattered light traveling away from the substrate. The second polarization filter includes a second polarization axis angularly offset from and not parallel with the first polarization axis. As such, the second polarization filter blocks the advancement of unscattered light while the scattered light is not blocked by the second polarization filter. The hole is detected based on an absence of unscattered light surrounded by light traveling from the second polarization filter.

Abstract: A method of printing composition(s) on a web is disclosed. The method includes the steps of advancing the web and printing a plurality of composition sites on the web. The method further includes the step of forming one or more discontinuities in the web. The discontinuities correspond to the printed composition sites.

Abstract: The present disclosure relates to methods and apparatuses for detecting registration features. The apparatuses and methods may utilize sensors in combination with cylindrical optics that blurs the image sampling area in the cross direction, while maintaining focus in the machine direction. The blurring may create an averaging or blending effect of the hue values across the sampled area. The sensors may include red, green, blue (RGB) analog outputs that can characterize sensed registration features by a unique sequence that can be compared with a reference sequence. In turn, the substrate speed and/or tension can be adjusted base on the comparison to control the relative placement of advancing substrates and discrete components in converting lines.

Abstract: The present disclosure relates to methods and apparatuses for monitoring substrates advancing along a converting apparatus in a machine direction. The apparatus may include an analyzer connected with a line scan camera through a communication network. The analyzer may be configured as a field programmable gate array, an application specific integrated circuit, or a graphical processing unit. In addition, the line scan camera may include a linear array of pixel data and define a linear field of view, wherein the line scan camera is arranged such that the linear field of view extends in the machine direction. The apparatus may further include an illumination source that illuminates the linear field of view. In operation, the substrate is advanced in the machine direction such that a portion of the substrate advances through the linear field of view. In turn, the apparatus may be configured to perform various monitoring and/or control functions.

Abstract: The present disclosure relates to methods and apparatuses sensing emitted light caused by fluorescence of adhesive to determine characteristics of absorbent structures during the manufacture of absorbent articles. Some absorbent articles may have absorbent structures that include an absorbent core disposed between a topsheet and a backsheet. And one or more of the absorbent structure components may be assembled with adhesive that fluoresces when excited by ultraviolet light. Aspects of the present methods relate to an inspection system that may be configured to interact with, monitor, and/or control a converting line. The inspection system may include a radiation source that illuminates a surface of an absorbent structure with ultraviolet light. A sensor may be adapted to receive light caused by fluorescence of the adhesive while being irradiated with the ultraviolet light. In turn, the inspection system may determine characteristics of the absorbent structure based on the detected emitted light.

Abstract: The present disclosure relates to methods and apparatuses for sensing distortions in patterns of reflected light to create profiles representing surface topographies of absorbent structures during the manufacture of absorbent articles. Inspection systems may include sensors arranged adjacent an advancing absorbent structure on a converting line. In turn, a controller may monitor and affect various operations on the converting line. The inspection systems herein may also include a radiation source that illuminates a surface of an absorbent structure with a predetermined pattern of light extending in the cross direction CD. The sensor senses distortions in patterns of light reflected from the illuminated surface of the absorbent structure and triangulates changes in elevation of the illuminated surface of the absorbent structure relative to the sensor.

Abstract: A system for imaging a distribution of an absorbent material within an absorbent article. The system includes a radiation source and a detector positioned such that the absorbent article is situated between the radiation source and the detector. The absorbent article includes an absorbent material having a spatial distribution within the absorbent article. Infrared radiation within a particular wavelength range (e.g., 3 ?m to 3.2 ?m) is more likely to be absorbed by the absorbent material than by other materials within the absorbent article. The radiation source is configured to generate infrared radiation incident on the absorbent article. The detector is configured to detect a quantity of the infrared radiation within the particular wavelength range that was transmitted through the absorbent article. The radiation source is further configured to generate data indicative of the spatial distribution of the absorbent material based on the detected quantity of the infrared radiation.

Abstract: A system for imaging a distribution of an absorbent material within an absorbent article. The system includes a radiation source and a detector positioned such that the absorbent article is situated between the radiation source and the detector. The absorbent article includes an absorbent material having a spatial distribution within the absorbent article. Infrared radiation within a particular wavelength range (e.g., 3 ?m to 3.2 ?m) is more likely to be absorbed by the absorbent material than by other materials within the absorbent article. The radiation source is configured to generate infrared radiation incident on the absorbent article. The detector is configured to detect a quantity of the infrared radiation within the particular wavelength range that was transmitted through the absorbent article. The radiation source is further configured to generate data indicative of the spatial distribution of the absorbent material based on the detected quantity of the infrared radiation.

Abstract: Various embodiments are directed to apparatuses for inspecting an on-line product web moving relative to the apparatus in a machine direction. The apparatuses may comprise a line-scan camera defining a field of view and positioned such that the field of view includes a portion of the product web. A camera control system may be in electronic communication with the camera and may be configured to receive from the web velocity sensor web velocity data indicating a velocity of the product web and convert the web velocity data to a line trigger signal. The line trigger signal may indicate a temporal frequency of camera image captures necessary to achieve a constant machine direction pixel resolution. Additionally, the camera control system may be configured to receive product position data and generate a frame trigger signal considering the product position data. The frame trigger signal may indicate a break between image frames.

Abstract: A system for imaging a distribution of an absorbent material within an absorbent article. The system includes a radiation source and a detector positioned such that the absorbent article is situated between the radiation source and the detector. The absorbent article includes an absorbent material having a spatial distribution within the absorbent article. Infrared radiation within a particular wavelength range (e.g., 3 ?m to 3.2 ?m) is more likely to be absorbed by the absorbent material than by other materials within the absorbent article. The radiation source is configured to generate infrared radiation incident on the absorbent article. The detector is configured to detect a quantity of the infrared radiation within the particular wavelength range that was transmitted through the absorbent article. The radiation source is further configured to generate data indicative of the spatial distribution of the absorbent material based on the detected quantity of the infrared radiation.