Abstract: Apparatus and associated methods relate to a bond-degradation device for testing EMI susceptibility and/or emission suppression of an electrical control system that includes a shielded cable assembly. The bond-degradation device includes a resistive annulus configured to be interposed between normally-connected first and second shielded connectors of the electrical control system. The resistive annulus introduces a resistance between shields of the normally-connected first and second shielded connectors, thereby compromising integrity of the shielding of conductive wires within the shielding of the shielded cable assembly by increasing loop resistance of the shielding.

Abstract: Disclosed is a lateral flow assay device useful for useful for detecting a variety of analytes in samples. Also disclosed are methods of using the device and other lateral flow assay sampling and detection methods. In general, the devices and methods allow for a lateral flow assay test to be conducted within a single, closed environment, thus minimizing risks of sample contamination as well as other potential hazards to the user.