Abstract: An electrical test probe assembly for use with a leadless surface mounted device is provided which includes an array of resilient spring contacts in a pattern corresponding to the contacts of a leadless device. The array of spring contacts are configured to grip the peripheral edges of a surface mounted device, with each spring contact in biased engagement with a respective contact of the device.

Abstract: A terminal plug body for interference-fit with a thin-walled annular end of an interconnection component makes possible a center-to-center spacing of adjacent interconnection components that is not limited except by the outside dimension of the adjacent components themselves. The terminal plug body includes a head portion and a tail portion. The head portion includes a first region over which the material of the thin-wall of the annular end elastically expands and a second region into which the material of the thin-wall of the annular end elastically collapses during interference-fit. The annular end of the interconnection component in this manner is repeatedly pluggable onto and off the terminal plug body each time reassuming its nominal shape without plastic deformation. A connector including the terminal plug body and any suitable interconnection component may with advantage be utilized.

Abstract: An electrical test probe in which spring biasing of the probe plunger is provided by the cooperative action of one or more laterally deflectable spring fingers cooperative with one or more angled surfaces. The plunger includes a ramped surface or surfaces which are cooperative with one or more spring fingers of a spring assembly and which are laterally movable to urge the plunger to a normally outward position. Alternatively, the spring assembly can be part of the movable plunger with the ramped surface or surfaces being fixed. The spring probe can be contained within a sleeve or can be mounted directly within an opening of a circuit board or other mounting member.