Patents by Inventor Steve Aochi

Steve Aochi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automatic probe configuration station and method therefor
    Patent number: 9103876
    Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.
    Type: Grant
    Filed: January 7, 2011
    Date of Patent: August 11, 2015
    Assignee: PHOTON DYNAMICS, INC.
    Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard
  • AUTOMATIC PROBE CONFIGURATION STATION AND METHOD THEREFOR
    Publication number: 20120319713
    Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.
    Type: Application
    Filed: January 7, 2011
    Publication date: December 20, 2012
    Applicant: PHOTON DYNAMICS, INC.
    Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard
  • Continuous linear scanning of large flat panel media
    Patent number: 7468611
    Abstract: A system performs continuous full linear scan of a flat media. The system includes, in part, a chuck, and at least first, second and third gantries. The chuck is adapted to support the flat media during the test. The first gantry includes at least one linear array of non-contacting sensors that spans the width of the flat media and is adapted to move across an entire length of the flat media. Each of the second and third gantries includes a probe head that spans the width of the flat media and each is adapted to apply an electrical signal to the flat media. Each probe head is further adapted to move along a direction substantially perpendicular to the surface of the flat media during the times when the first gantry is in motion and while test signals are being continuously applied.
    Type: Grant
    Filed: October 19, 2007
    Date of Patent: December 23, 2008
    Assignee: Photon Dynamics, Inc.
    Inventors: Kent Nguyen, Eric Thompson, Hai Tran, Kaushal Gangakhedkar, Robert Barnett, Daniel Toet, David Baldwin, Steve Aochi, Neil Nguyen
  • CONTINUOUS LINEAR SCANNING OF LARGE FLAT PANEL MEDIA
    Publication number: 20080094081
    Abstract: A system performs continuous full linear scan of a flat media. The system includes, in part, a chuck, and at least first, second and third gantries. The chuck is adapted to support the flat media during the test. The first gantry includes at least one linear array of non-contacting sensors that spans the width of the flat media and is adapted to move across an entire length of the flat media. Each of the second and third gantries includes a probe head that spans the width of the flat media and each is adapted to apply an electrical signal to the flat media. Each probe head is further adapted to move along a direction substantially perpendicular to the surface of the flat media during the times when the first gantry is in motion and while test signals are being continuously applied.
    Type: Application
    Filed: October 19, 2007
    Publication date: April 24, 2008
    Applicant: Photon Dynamics, Inc.
    Inventors: Kent Nguyen, Eric Thompson, Hai Tran, Kaushal Gangakhedkar, Robert Barnett, Daniel Toet, David Baldwin, Steve Aochi, Neil Nguyen