Abstract: A novel and useful table tennis paddle for use during the play of any racket or paddle sport but preferably table tennis is provided and includes: a blade having a head and a handle extending from the head. The blade comprises a first layer, a second layer coupled to the first layer, a third layer coupled to the second layer, a fourth layer coupled to the third layer, and a fifth layer coupled to the fourth layer. Moreover, the first layer preferably comprises three sub-layers, the second layer preferably comprises one sub-layer, the third layer preferably comprises three sub-layers, the fourth layer preferably comprises one layer, and the fifth layer preferably comprises three sub-layers.

Abstract: A modular, expandable lighting system comprising at least one light emitting diode segment having at least one printed circuit board, at least one light emitting diode and at least one pair of terminals connected to said printed circuit board and means for fixedly but removable fastening and mounting said light emitting diode segment with ease in tight spaces.

Abstract: A system for obtaining an image of a cross-sectional surface of a workpiece includes a shaped beam ion projection column oriented along a first axis. The ion projection column projects an image of an aperture on the workpiece surface, thereby excavating a portion of the surface and exposing a cross-sectional surface. Because the ion beam is not focused on the surface, a low brightness ion source can be used. A focused particle beam column, typically a scanning electron microscope, is oriented along a second axis that intersects the first axis at a selected angle. This focused particle beam column generates a particle beam that is used to image the cross-sectional surface exposed by the ion projection column.

Abstract: A system for obtaining an image of a cross-sectional surface of a workpiece includes a shaped beam ion projection column oriented along a first axis. The ion projection column projects an image of an aperture on the workpiece surface, thereby excavating a portion of the surface and exposing a cross-sectional surface. Because the ion beam is not focused on the surface, a low brightness ion source can be used. A focused particle beam column, typically a scanning electron microscope, is oriented along a second axis that intersects the first axis at a selected angle. This focused particle beam column generates a particle beam that is used to image the cross-sectional surface exposed by the ion projection column.

Abstract: A system for obtaining an image of a cross-sectional surface of a workpiece includes a shaped beam ion projection column oriented along a first axis. The ion projection column projects an image of an aperture on the workpiece surface, thereby excavating a portion of the surface and exposing a cross-sectional surface. Because the ion beam is not focused on the surface, a low brightness ion source can be used. A focused particle beam column, typically a scanning electron microscope, is oriented along a second axis that intersects the first axis at a selected angle. This focused particle beam column generates a particle beam that is used to image the cross-sectional surface exposed by the ion projection column.