Patents by Inventor Steve Duncan

Steve Duncan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7116741
    Abstract: A partial Fourier Transform is performed, using Goertzel's algorithm, to calculate two frequency bins. A phase variation is calculated for each bin, the phase variation preferably representing the phase difference between the bin calculated by a Fourier Transform performed on samples in a guard interval and the bin calculated by a Fourier Transform performed on matching samples within the useful part of the symbol. The local oscillator frequency offset is compensated by summing the phase variations, and the sampling frequency offset is compensated by taking the difference between the phase variations.
    Type: Grant
    Filed: April 10, 2001
    Date of Patent: October 3, 2006
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Steve Duncan, Rob Heaton
  • Patent number: 7075997
    Abstract: FFT demodulation of OFDM symbols is achieved using a frame synchronization pulse generated by deriving absolute values of successive complex samples of the OFDM symbol, determining the difference between such values and other values separated therefrom by a period representing the useful part of the OFDM symbol, integrating the difference values over a plurality of symbols and determining the sample position representing the point at which the integrated difference values substantially change.
    Type: Grant
    Filed: August 21, 2000
    Date of Patent: July 11, 2006
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventor: Steve Duncan
  • Publication number: 20020159534
    Abstract: A partial Fourier Transform is performed, using Goertzel's algorithm, to calculate two frequency bins. A phase variation is calculated for each bin, the phase variation preferably representing the phase difference between the bin calculated by a Fourier Transform performed on samples in a guard interal and the bin calculated by a Fourier Transform performed on matching samples within the useful part of the symbol. The local oscillator frequency offset is compensated by summing the phase variations, and the sampling frequency offset is compensated by taking the difference between the phase variations.
    Type: Application
    Filed: December 17, 2001
    Publication date: October 31, 2002
    Inventors: Steve Duncan, Rob Heaton