Patents by Inventor Steve G. Gonzalez

Steve G. Gonzalez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8662676
    Abstract: Devices and techniques are described for automatically calibrating a projector system. The projector system undergoing calibration is coupled to a computing device and an automated positioning platform coupled to a target structure. The computing device acquires images using a calibrated camera of one or more patterns projected by the projector onto the target structure when the target structure is in a plurality of repeatable poses. From these acquired images, intrinsic projector parameters may be determined. Once determined, the parameters may be used to correct images produced by the projector or acquired by the camera which include a projected pattern or portion thereof.
    Type: Grant
    Filed: September 27, 2012
    Date of Patent: March 4, 2014
    Assignee: Rawles LLC
    Inventors: Samuel Henry Chang, Edward Dietz Crump, Manika Puri, Steve G. Gonzalez
  • Patent number: 8619144
    Abstract: Devices and techniques are described for automatically calibrating a camera system. The camera system undergoing calibration is coupled to a computing device and an automated positioning platform coupled to a target structure. The computing device acquires images from the camera of the target structure in a plurality of repeatable poses. From these acquired images, intrinsic camera parameters may be determined. Once determined, the parameters may be used to correct images acquired by the camera system.
    Type: Grant
    Filed: March 14, 2012
    Date of Patent: December 31, 2013
    Assignee: Rawles LLC
    Inventors: Samuel Henry Chang, Manika Puri, Edward Dietz Crump, Steve G. Gonzalez
  • Patent number: 7920254
    Abstract: Aspects include metrology methods and systems for determining characteristics of conical shaft portions, such as angle of taper and crown height. In an example, a metrology system includes a fixture for supporting a workpiece. The fixture provides for translation in a longitudinal dimension, and rotation about an axis of symmetry. The system may include a sensor mounted for scanning lines including sections of the workpiece as well as control logic for coordinating translation of the workpiece to provide for an approximately constant ratio of longitudinal translation and lines scanned during scanning operations. The system may include image logic for assembling an image from image data generated during each scanning operation, edge detection logic for detecting an edge shape in each assembled image, and slope and crown height calculation logic for calculating a slope and a crown height of each of the detected edge shapes.
    Type: Grant
    Filed: October 15, 2008
    Date of Patent: April 5, 2011
    Assignee: Seagate Technology LLC
    Inventors: Ananda V. Mysore, Steve G. Gonzalez
  • Patent number: 7885786
    Abstract: A metrology system for measuring a cone angle, a cone straightness, and a cone quality of a sample and method of using the metrology system are disclosed. The system includes a rotary stage, one or more workpiece fixtures that hold the samples in the rotary stage, and a number of different sized measurement devices. The measuring devices are positioned next to the rotary stage and measure the samples using contact. The rotary stage is free to rotate when the measuring devices are in a non-measuring state. The invention also includes a processor that collects data from the measurement devices and calculates the cone angle, the cone straightness, and the cone quality of each sample based on the data.
    Type: Grant
    Filed: October 15, 2008
    Date of Patent: February 8, 2011
    Assignee: Seagate Technology LLC
    Inventors: Ananda V. Mysore, Steve G. Gonzalez, Reid E. Berry, II, Hans Leuthold
  • Publication number: 20100094587
    Abstract: A metrology system for measuring a cone angle, a cone straightness, and a cone quality of a sample and method of using the metrology system are disclosed. The system includes a rotary stage, one or more workpiece fixtures that hold the samples in the rotary stage, and a number of different sized measurement devices. The measuring devices are positioned next to the rotary stage and measure the samples using contact. The rotary stage is free to rotate when the measuring devices are in a non-measuring state. The invention also includes a processor that collects data from the measurement devices and calculates the cone angle, the cone straightness, and the cone quality of each sample based on the data.
    Type: Application
    Filed: October 15, 2008
    Publication date: April 15, 2010
    Applicant: SEAGATE TECHNOLOGY LLC
    Inventors: Ananda V. Mysore, Steve G. Gonzalez, Reid E. Berry, II, Hans Leuthold
  • Publication number: 20100094588
    Abstract: Aspects include metrology methods and systems for determining characteristics of conical shaft portions, such as angle of taper and crown height. In an example, a metrology system includes a fixture for supporting a workpiece. The fixture provides for translation in a longitudinal dimension, and rotation about an axis of symmetry. The system may include a sensor mounted for scanning lines including sections of the workpiece as well as control logic for coordinating translation of the workpiece to provide for an approximately constant ratio of longitudinal translation and lines scanned during scanning operations. The system may include image logic for assembling an image from image data generated during each scanning operation, edge detection logic for detecting an edge shape in each assembled image, and slope and crown height calculation logic for calculating a slope and a crown height of each of the detected edge shapes.
    Type: Application
    Filed: October 15, 2008
    Publication date: April 15, 2010
    Applicant: SEAGATE TECHNOLOGY LLC
    Inventors: Ananda V. Mysore, Steve G. Gonzalez
  • Patent number: 7421795
    Abstract: A metrology system comprises a support structure, a fixture having a bottom surface resting on a surface of the support structure and moveable relative to the support structure, and a first measurement assembly for interacting with a workpiece held by the fixture to measure a characteristic of the workpiece. One of the bottom surface of the fixture and the surface of the support structure comprises sapphire, and the other of the bottom surface of the fixture and the surface of the support structure comprises a metal.
    Type: Grant
    Filed: August 4, 2006
    Date of Patent: September 9, 2008
    Assignee: Seagate Technology LLC
    Inventors: Ananda V. Mysore, Steve G. Gonzalez
  • Patent number: 7350308
    Abstract: For repeatably and accurately measuring characteristics of workpieces, such angle of taper of a conical cavity defined by a workpiece, examples may include a system having a stage movable in predictable and repeatable increments, and a compliancy fixture. The compliancy feature may include a sapphire to metal interface. Such examples may also include a mechanism, such as an elongate body or an arm, for alternately disposing each of a first object of a first size and a second object of a second size in the conical cavity. Examples may use spherical objects, or portions thereof. Systems further include at least one sensor for determining positions of the first and second objects in the conical cavity and logic for determining the characteristics, such the taper angle, based on the position of the first object and the second object in the conical cavity.
    Type: Grant
    Filed: December 20, 2005
    Date of Patent: April 1, 2008
    Assignee: Seagate Technology LLC
    Inventors: Ananda V. Mysore, Steve G. Gonzalez
  • Publication number: 20080028627
    Abstract: A metrology system comprises a support structure, a fixture having a bottom surface resting on a surface of the support structure and moveable relative to the support structure, and a first measurement assembly for interacting with a workpiece held by the fixture to measure a characteristic of the workpiece. One of the bottom surface of the fixture and the surface of the support structure comprises sapphire, and the other of the bottom surface of the fixture and the surface of the support structure comprises a metal.
    Type: Application
    Filed: August 4, 2006
    Publication date: February 7, 2008
    Applicant: SEAGATE TECHNOLOGY LLC
    Inventors: Ananda V. Mysore, Steve G. Gonzalez
  • Patent number: 7253889
    Abstract: Aspects include metrology methods and systems for determining characteristics of conical shaft portions, such as angle of taper. In an example, a metrology system includes a fixture for supporting a workpiece. The fixture provides for translation in a longitudinal dimension, and rotation about an axis of symmetry. The system may include a sensor mounted for scanning lines including sections of the workpiece as well as control logic for coordinating translation of the workpiece to provide for an approximately constant ratio of longitudinal translation and lines scanned during scanning operations. The system may include image logic for assembling an image from image data generated during each scanning operation; edge detection logic for detecting at least one edge shape in each assembled image; and slope calculation logic for calculating a slope of each of the at least one detected edge shape.
    Type: Grant
    Filed: December 21, 2005
    Date of Patent: August 7, 2007
    Assignee: Seagate Technology LLC
    Inventors: Ananda V. Mysore, Steve G. Gonzalez
  • Patent number: 6904790
    Abstract: A system and method for characterizing and measuring hydrodynamic grooves made by ECM processes is disclosed. The method includes a procedure for alignment of the work piece to the measurement apparatus as well as a technique for accurately reliably measuring the erosion pattern quickly. Additionally, the invention provides a system for characterizing and measuring the erosion of these grooves.
    Type: Grant
    Filed: June 18, 2003
    Date of Patent: June 14, 2005
    Assignee: Seagate Technology LLC
    Inventors: Mysore Venkatachalan Ananda, Steve G. Gonzalez, Christopher Rowe Hakes
  • Publication number: 20040025577
    Abstract: A system and method for characterizing and measuring hydrodynamic grooves made by ECM processes is disclosed. The method includes a procedure for alignment of the work piece to the measurement apparatus as well as a technique for accurately reliably measuring the erosion pattern quickly. Additionally, the invention provides a system for characterizing and measuring the erosion of these grooves.
    Type: Application
    Filed: June 18, 2003
    Publication date: February 12, 2004
    Inventors: Mysore Venkatachalan Ananda, Steve G. Gonzalez, Christopher Rowe Hakes