Patents by Inventor Steve James Lakeman

Steve James Lakeman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240241083
    Abstract: A system and method for determining the changes in resonance frequency in crystal microbalance (CM) sensors and the resulting changes in the determination of incremental mass on the CM sensors caused by temperature. Dual mode resonances and coefficients are used in a deconvolution process to determine and extract the frequency shift caused by temperature to provide the temperature compensated incremental mass (?M). In one embodiment, dual mode analysis is provided using a mass mode (e.g., the c-mode fundamental frequency (fc100)) and a temperature mode (e.g., the anharmonic frequency (fc102)) and associated coefficients. In other embodiments that are more sensitive to temperature changes, dual mode analysis is provided using the b-mode fundamental frequency (fb100) as the temperature-mode and associated coefficients.
    Type: Application
    Filed: May 6, 2022
    Publication date: July 18, 2024
    Applicant: INFICON, Inc.
    Inventors: Chunhua Song, Mohamed B. Rinzan, Steve James Lakeman, Lukas Baumgartel, Matan Lapidot, Brian O'Neill
  • Patent number: 11929270
    Abstract: A monitoring device for monitoring a fabrication process in a fabrication system. The monitored fabrication system includes a process chamber and a plurality of flow components. A quartz crystal microbalance (QCM) sensor monitors one flow component of the plurality of flow components of the fabrication system and is configured for exposure to a process chemistry in the one flow component during the fabrication process. A controller measures resonance frequency shifts of the QCM sensor due to interactions between the QCM sensor and the process chemistry in the one flow component during the fabrication process. The controller determines a parameter of the fabrication process in the process chamber as a function of the measured resonance frequency shifts of the QCM sensor within the one flow component.
    Type: Grant
    Filed: May 16, 2022
    Date of Patent: March 12, 2024
    Inventors: Mohamed Buhary Rinzan, Chunhua Song, Steve James Lakeman
  • Publication number: 20220285184
    Abstract: A monitoring device for monitoring a fabrication process in a fabrication system. The monitored fabrication system includes a process chamber and a plurality of flow components. A quartz crystal microbalance (QCM) sensor monitors one flow component of the plurality of flow components of the fabrication system and is configured for exposure to a process chemistry in the one flow component during the fabrication process. A controller measures resonance frequency shifts of the QCM sensor due to interactions between the QCM sensor and the process chemistry in the one flow component during the fabrication process. The controller determines a parameter of the fabrication process in the process chamber as a function of the measured resonance frequency shifts of the QCM sensor within the one flow component.
    Type: Application
    Filed: May 16, 2022
    Publication date: September 8, 2022
    Applicant: INFICON, Inc.
    Inventors: Mohamed Buhary Rinzan, Chunhua Song, Steve James Lakeman
  • Patent number: 11335575
    Abstract: A monitoring device for monitoring a fabrication process in a fabrication system. The monitored fabrication system includes a process chamber and a plurality of flow components. A quartz crystal microbalance (QCM) sensor monitors one flow component of the plurality of flow components of the fabrication system and is configured for exposure to a process chemistry in the one flow component during the fabrication process. A controller measures resonance frequency shifts of the QCM sensor due to interactions between the QCM sensor and the process chemistry in the one flow component during the fabrication process. The controller determines a parameter of the fabrication process in the process chamber as a function of the measured resonance frequency shifts of the QCM sensor within the one flow component.
    Type: Grant
    Filed: August 24, 2018
    Date of Patent: May 17, 2022
    Assignee: INFICON, Inc.
    Inventors: Mohamed Buhary Rinzan, Chunhua Song, Steve James Lakeman
  • Publication number: 20200176291
    Abstract: A monitoring device for monitoring a fabrication process in a fabrication system. The monitored fabrication system includes a process chamber and a plurality of flow components. A quartz crystal microbalance (QCM) sensor monitors one flow component of the plurality of flow components of the fabrication system and is configured for exposure to a process chemistry in the one flow component during the fabrication process. A controller measures resonance frequency shifts of the QCM sensor due to interactions between the QCM sensor and the process chemistry in the one flow component during the fabrication process. The controller determines a parameter of the fabrication process in the process chamber as a function of the measured resonance frequency shifts of the QCM sensor within the one flow component.
    Type: Application
    Filed: August 24, 2018
    Publication date: June 4, 2020
    Applicant: INFICON. Inc.
    Inventors: Mohamed Buhary Rinzan, Chunhua Song, Steve James Lakeman