Abstract: The screening of edge-emitting laser diode bars in a production line is permitted by fabricating the source electrodes of each diode in the bar in two parts spaced apart to form a window aligned with the lasing cavity of the diode. Such windows have been made in failed devices to determine the cause of failure. Here, the windows are formed in a wafer stage of fabrication for later separation into laser bars or individual laser diodes. All wafers, all laser bars and all laser diodes are fabricated with windows thus permitting automatic screening during fabrication rather than opening a window to examine only failed devices as is the case in the prior art.