Abstract: An input device for detecting input with respect to a three dimensional area in space. The input device includes an electromagnetic wave interference projector and receiver. The analysis of the difference between the projected interference pattern and the received interference pattern will determine the type and location of the user input. In addition, this holographic type of wave interference will display the image to be “manipulated” or “touched”.

Abstract: An input device for detecting input with respect to a three dimensional area in space. The input device includes an electromagnetic wave interference projector and receiver. The analysis of the difference between the projected interference pattern and the received interference pattern will determine the type and location of the user input. In addition, this holographic type of wave interference will display the image to be “manipulated” or “touched”.

Abstract: An input device for detecting input with respect to a reference plane. The input device includes one or more light sensors positioned to sense light at an acute angle with respect to the reference plane and for generating a signal indicative of sensed light, and a circuit responsive to said light sensor for determining a position of an object with respect to the reference plane.

Abstract: There is disclosed a system for visually measuring the cross-sectional thickness of a light-reflective object, such as a vehicle wheel, said object having a plurality of curved surfaces. The system includes: means for transmitting a line of light onto each curved surface of the object at substantially the same cross-sectional area through the object; means for sensing the lines of light reflected from each curved surface and producing a plurality of signals thereby, said signals representing a linear profile of each curved surface at the same cross-sectional area; and means for comparing the profile signals from each curved surface for calculating a cross-sectional thickness of the object at one or more points along the same cross-sectional area. On a more preferred basis, this system further includes means for supporting the object, and means for rotating the object about at least one axis of support to measure a plurality of cross-sectional thicknesses thereof.