Abstract: An apparatus and method of manufacturing a motherboard is disclosed. The motherboard can include one or more electrochromic devices. The apparatus can include a central processing unit that executes instructions. The instructions and method can include mapping the motherboard, analyzing one or more electrochromic devices within a batch to determine a yield of each of the one or more electrochromic devices, prioritizing the one or more electrochromic devices based on the yield, and placing a first electrochromic device on the motherboard, where the first electrochromic device has the highest priority of the one or more electrochromic devices within the batch.

Abstract: System (1) and method (100) for detecting and repairing a defect in an electrochromic device (30) may include acquiring a thermal image of the electrochromic device (30) when the device is in an operating state. In addition, the system and method may include processing thermal imaging data representative of the thermal image to detect a defect in the electrochromic device by comparing a thermal amplitude detected at one or more pixels of the thermal image with a predetermined value, and to determine a location of the electrochromic device corresponding to the detected defect.

Abstract: A frequency modulated spectroscopy system, including a photo-detector, a band-pass filter to filter the output of the photo-detector, and a rectifier to demodulate. The band-pass filter has a relatively high Q factor. With the high Q factor band-pass filter and rectifier, a reference sinusoid is not required for demodulation, resulting in phase-insensitive spectroscopy. Other embodiments are described and claimed.