Patents by Inventor Steve R Hornberger

Steve R Hornberger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for injection of external data within an implantable medical device
    Patent number: 7123965
    Abstract: A method and an apparatus for performing implementing external data into an implantable medical device. A first stress test is performed using an external sensor. External data resulting from the initial stress test is acquired. An external data injection process is performed. The external data injection process includes providing the external data to the implantable medical device. A second stress test is performed, the second stress test being substantially similar to the first stress test. Internal data resulting from the second stress test is acquired. Internal data resulting from the second stress test along with the external data resulting from the first stress test, are processed.
    Type: Grant
    Filed: April 30, 2002
    Date of Patent: October 17, 2006
    Assignee: Medtronic, Inc.
    Inventors: Catherine R. Condie, Gerald A. Portzline, Yong Kyun Cho, John S. Brandstetter, Luc R. Mongeon, Lucy M. Nichols, Steve R Hornberger
  • Method and apparatus for injection of external data within an implantable medical device
    Publication number: 20030204147
    Abstract: A method and an apparatus for performing implementing external data into an implantable medical device. A first stress test is performed using an external sensor. External data resulting from the initial stress test is acquired. An external data injection process is performed. The external data injection process includes providing the external data to the implantable medical device. A second stress test is performed, the second stress test being substantially similar to the first stress test. Internal data resulting from the second stress test is acquired. Internal data resulting from the second stress test along with the external data resulting from the first stress test, are processed.
    Type: Application
    Filed: April 30, 2002
    Publication date: October 30, 2003
    Inventors: Catherine R. Condie, Gerald A. Portzline, Yong Kyun Cho, John S. Brandstetter, Luc R. Mongeon, Lucy M. Nichols, Steve R. Hornberger