Patents by Inventor Steve Rhieu

Steve Rhieu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods enabling high-throughput, real time detection of analytes
    Patent number: 9285314
    Abstract: System and methods for detecting analytes are provided. The system includes a plasmonic interferometer with a first surface having a first and second scattering element and an aperture disposed between the first scattering element and the second scattering element. A first distance between the aperture and the first scattering element and a second distance between the aperture and the second scattering element are selected to provide interference of light at the slit. The system also includes a light source for illuminating the first surface of the plasmonic interferometer, a detector positioned for detecting light transmitted through the aperture, and a sample holder for disposing a sample to be analyzed onto the first surface of the plasmonic interferometer.
    Type: Grant
    Filed: October 12, 2012
    Date of Patent: March 15, 2016
    Assignee: Brown University
    Inventors: Domenico Pacifici, Henri J. Lezec, Tayhas G. r. Palmore, Vince Siu, Vihang Mehta, Alec Roelke, Steve Rhieu, Jing Feng
  • SYSTEMS AND METHODS ENABLING HIGH-THROUGHPUT, REAL TIME DETECTION OF ANALYTES
    Publication number: 20140327913
    Abstract: System and methods for detecting analytes are provided. The system includes a plasmonic interferometer with a first surface having a first and second scattering element and an aperture disposed between the first scattering element and the second scattering element. A first distance between the aperture and the first scattering element and a second distance between the aperture and the second scattering element are selected to provide interference of light at the slit. The system also includes a light source for illuminating the first surface of the plasmonic interferometer, a detector positioned for detecting light transmitted through the aperture, and a sample holder for disposing a sample to be analyzed onto the first surface of the plasmonic interferometer.
    Type: Application
    Filed: October 12, 2012
    Publication date: November 6, 2014
    Inventors: Domenico Pacifici, Henri J. Lezec, Tayhas G.r. Palmore, Vince Siu, Vihang Mehta, Alec Roelke, Steve Rhieu, Jing Feng