Abstract: An embodiment of the invention includes a receiver with reduced error terms and incoming jitter tracking that improves jitter tolerance. An embodiment provides these benefits based on a voltage integrator that recovers data and clock information from incoming signals without use of a PLL, PI, CDR, and the like. An embodiment provides these benefits based on a time integrator that recovers, using digital logic, data and clock information from incoming signals without use of a PLL, PI, CDR, and the like. Other embodiments are described herein.

Abstract: Apparatus, methods, and systems are herein described for providing a method for calibrating a channel by employing a training sequence during at least one blanking interval. In one embodiment, an apparatus includes a first control logic to send a command to generate a predetermined data pattern during at least one blanking interval. In addition, the apparatus includes a second control logic to determine whether a received data pattern matches the predetermined data pattern.

Abstract: An embodiment of the invention includes a receiver with reduced error terms and incoming jitter tracking that improves jitter tolerance. An embodiment provides these benefits based on a voltage integrator that recovers data and clock information from incoming signals without use of a PLL, PI, CDR, and the like. An embodiment provides these benefits based on a time integrator that recovers, using digital logic, data and clock information from incoming signals without use of a PLL, PI, CDR, and the like. Other embodiments are described herein.

Abstract: A system and method for generating multiple drive strengths for one or more output signals of a memory controller operable to control a memory subsystem. The system includes a state machine operable to generate an n-bit output representative of a drive strength operable to drive the one or more output signals; and a plurality of adders, each adder having a plurality of n-bit inputs, each input receiving a selective set of bits from the n-bit output of the state machine, the adders generating a plurality of n-bit outputs representative of drive strengths operable to drive the output signals. The method includes generating an n-bit output representative of a drive strength, and adding combinations of two or more selective sets of bits from the n-bit output to generate a plurality of n-bit outputs representative of a plurality of drive strengths that are operable to drive the output signal.

Abstract: A single external impedance element is used to perform multiple circuit compensation. A reference impedance code is first generated based on matching an internal impedance generated by transistors with an impedance of the external impedance element, and then the reference impedance code can be shifted to generate new impedance codes according to impedance requirements of various different circuits that require compensation. Use of the single external impedance element for compensation of multiple circuits reduces motherboard and packaging costs. Chip area is also conserved since simpler compensation circuits can be used.

Abstract: A system and method for generating multiple drive strengths for one or more output signals of a memory controller operable to control a memory subsystem. The system includes a state machine operable to generate an n-bit output representative of a drive strength operable to drive the one or more output signals; and a plurality of adders, each adder having a plurality of n-bit inputs, each input receiving a selective set of bits from the n-bit output of the state machine, the adders generating a plurality of n-bit outputs representative of drive strengths operable to drive the output signals. The method includes generating an n-bit output representative of a drive strength, and adding combinations of two or more selective sets of bits from the n-bit output to generate a plurality of n-bit outputs representative of a plurality of drive strengths that are operable to drive the output signal.

Abstract: A single external impedance element is used to perform multiple circuit compensation. A reference impedance code is first generated based on matching an internal impedance generated by transistors with an impedance of the external impedance element, and then the reference impedance code can be shifted to generate new impedance codes according to impedance requirements of various different circuits that require compensation. Use of the single external impedance element for compensation of multiple circuits reduces motherboard and packaging costs. Chip area is also conserved since simpler compensation circuits can be used.

Abstract: A single external impedance element is used to perform multiple circuit compensation. A reference impedance code is first generated based on matching an internal impedance generated by transistors with an impedance of the external impedance element, and then the reference impedance code can be shifted to generate new impedance codes according to impedance requirements of various different circuits that require compensation. Use of the single external impedance element for compensation of multiple circuits reduces motherboard and packaging costs. Chip area is also conserved since simpler compensation circuits can be used.

Abstract: A single external impedance element is used to perform multiple circuit compensation. A reference impedance code is first generated based on matching an internal impedance generated by transistors with an impedance of the external impedance element, and then the reference impedance code can be shifted to generate new impedance codes according to impedance requirements of various different circuits that require compensation. Use of the single external impedance element for compensation of multiple circuits reduces motherboard and packaging costs. Chip area is also conserved since simpler compensation circuits can be used.