Abstract: An electrical connector assembly comprising a housing having an interior chamber defining at least one lead frame plane, and identical sets of non-identical lead frame elements. The lead frame plane has a reference point. The lead frame elements are mounted in the interior chamber and aligned within at least one lead frame plane. The lead frame elements are adjustable along the lead frame plane between multiple levels with respect to the reference point. The multiple mating levels of the lead frame elements are created from only one lead frame. The mating levels are selected by the individual lead frame elements being positioned with respect to the reference point. The electrical connector also comprises N lead frame elements, each of which is adjustable between M mating levels to form X lead frame configurations, wherein X=MN.

Abstract: An electrical connector assembly comprising a housing having an interior chamber defining at least one lead frame plane, and identical sets of non-identical lead frame elements. The lead frame plane has a reference point. The lead frame elements are mounted in the interior chamber and aligned within at least one lead frame plane. The lead frame elements are adjustable along the lead frame plane between multiple levels with respect to the reference point. The multiple mating levels of the lead frame elements are created from only one lead frame. The mating levels are selected by the individual lead frame elements being positioned with respect to the reference point. The electrical connector also comprises N lead frame elements, each of which is adjustable between M mating levels to form X lead frame configurations, wherein X=MN.

Abstract: A system and method for evaluating the thermal bond between a heat-producing device and a heat-absorbing apparatus. The heat-producing device may be a CPU, such as an INTEL PENTIUM microprocessor, and the heat-absorbing apparatus may be a heat sink. The two may be joined with a heat-conducting substance such as thermal grease or adhesive. In one exemplary embodiment, the heat-producing device is operated at a first power level, a first temperature measurement is then taken, the device is operated at a second power level, and then a second temperature measurement is then taken. The thermal resistance is then calculated, which may involve subtracting the second temperature from the first, and may involve dividing by the power level. The first power level may be full power, and the second power level may be near zero.