Patents by Inventor Steven C. Medeiros

Steven C. Medeiros has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optimization and control of microstructure development during hot metal working
    Patent number: 6233500
    Abstract: A method for predicting process parameters for optimization and control of microstructure in metal and alloy products of hot working fabrication processes is described. The method uses state-space material behavior models and hot deformation process models for calculating optimal strain, strain rate and temperature trajectories for processing the material. Using the optimal trajectories and appropriate optimality criteria, suitable process parameters such as ram velocity and die profile for processing the material are determined to achieve prescribed strain, strain rate and temperature trajectories.
    Type: Grant
    Filed: April 2, 1998
    Date of Patent: May 15, 2001
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: James C. Malas, W. Garth Frazier, Enrique A. Medina, Venkat Seetharaman, S. Venugopal, R. Dennis Irwin, William M. Mullins, Steven C. Medeiros, Anil Chaudhary, Raghavan Srinivasan
  • High speed titanium alloy microstructural conversion method
    Patent number: H2227
    Abstract: A high speed titanium alloy microstructural conversion method from lamellar to equiaxed is disclosed. The method includes identification and estimation of process parameters such that the average strain rate is between about 1-100 s?1 and the deformation temperature of the material is in the range of about 975°-1010° C.
    Type: Grant
    Filed: November 13, 2002
    Date of Patent: December 2, 2008
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Seshacharyulu Tamirisakandala, Prasad VRK Yellapregada, Steven C. Medeiros, William G. Frazier, James C. Malas