Abstract: A test socket for integrated circuits includes a base, a lid, and a latch providing a mechanical advantage. The base includes a nest which may move translationally and rotationally relative to the base. The nest is biased upward by coil springs mounted in the base. Spring-loaded contact pins extend through the base and the nest to make electrical connections between the integrated circuit and a circuit board to which the test socket is attached. The base also includes a nest support mounted below the nest to limit the downward travel of the nest to a selected distance. Furthermore, the nest has legs which connect to the base in a manner that limits upward travel to a selected distance. The lid includes a pressure pad which may move translationally relative to the lid. The pressure pad is spring-loaded by means of a flat spring contacting a ramp formed on the top side of the pressure pad in an inverted V-shape.

Abstract: A test socket for integrated circuits includes a lid having a pressure pad which may move independently of the lid. The pressure pad is operated by a lever creating a large mechanical advantage and is provided to apply a large normal force to an integrated circuit in the test socket after the lid is closed to ensure good electrical contact between the integrated circuit device and the contact pins of the test socket.