Abstract: The present invention provides a tool for and method of using an infrared transmission technique to extract the full stress components of the in-plane residual stresses in thin, multi crystalline silicon wafers including in situ measurement of residual stress for large cast wafers. The shear difference method is used to obtain full stress components by integrating the shear stress map from the boundaries. System ambiguity at the boundaries is resolved completely by introducing a new analytical function. A new anisotropic stress optic law is provided, and stress optic coefficients are calibrated for different crystal grain orientations and stress orientations.

Abstract: The present invention provides a tool for and method of using an infrared transmission technique to extract the full stress components of the in-plane residual stresses in thin, multi crystalline silicon wafers including in situ measurement of residual stress for large cast wafers. The shear difference method is used to obtain full stress components by integrating the shear stress map from the boundaries. System ambiguity at the boundaries is resolved completely by introducing a new analytical function. A new anisotropic stress optic law is provided, and stress optic coefficients are calibrated for different crystal grain orientations and stress orientations.

Abstract: The present invention provides a tool for and method of using an infrared transmission technique to extract the full stress components of the in-plane residual stresses in thin, multi crystalline silicon wafers including in situ measurement of residual stress for large cast wafers. The shear difference method is used to obtain full stress components by integrating the shear stress map from the boundaries. System ambiguity at the boundaries is resolved completely by introducing a new analytical function. A new anisotropic stress optic law is provided, and stress optic coefficients are calibrated for different crystal grain orientations and stress orientations.

Abstract: A method and system for determining chemical properties of a fluid. The method and system include providing a weak electrolyte fluid, a container for the fluid, a detection method performed by a device having at least two electrodes, a detection and amplification device coupled to the electrodes and a sensed current compared to an uncontaminated, base fluid or compared to data characteristic of fluid contaminated or chemically changed in order to monitor and characterize the fluid.

Abstract: A method and system for determining chemical properties of a fluid. The method and system include providing a weak electrolyte fluid, a container for the fluid, a detection method performed by a device having at least two electrodes, a detection and amplification device coupled to the electrodes and a sensed current compared to an uncontaminated, base fluid or compared to data characteristic of fluid contaminated or chemically changed in order to monitor and characterize the fluid.

Abstract: A method and system for contact potential sensing of dielectric properties of a fluid. The method and system include a contact potential sensor, an open or closed loop for passing a fluid past the sensor, measuring a contact potential to characterize dielectric properties of the fluid and outputting the dielectric property information for analysis and response thereto.

Abstract: A nondestructive testing method of condensed matter surfaces, and a sensing device for the measurement of the work function of the surface of a conducting or semiconducting sample. The sensing device includes an ionization chamber, a probe having a first surface, and a potential difference measurement circuit that is capable of measuring a difference in potential between the first surface of the probe and a surface made of another material to be tested. The ionization chamber produces ionized particles that travel out of an output of the ionization chamber and toward the probe. The probe is a non-vibrating probe having a first surface that is either a positively or negatively charged electrode. The measurement circuit of the present invention is capable of sensing the small amount of electrical current that the electrons and ions moving toward the first surface and the testing surface represent.

Abstract: An ionization contact potential difference gyroscope including a housing enclosing a first and second electrode with a gas, further including an ionization source capable of providing ions from the gas, and a contact potential difference measurement circuit that is capable of measuring an electrical signal related to the amount of ions striking at least one of the two surfaces. The measurement circuit of the present invention is capable of sensing the small amount of electrical current flowing as the electrons and ions strike one or both of the surfaces.

Abstract: A contact potential difference battery and method of application. The battery includes at least two different materials having different Fermi levels and electrically coupled together. A radiation source is disposed near the two materials and an ionizable gas is present therebetween. The radiation emitted by the radiation source ionizes the gas causing the ions to strike the two materials and cause an electric current flow in the circuit. This battery can also be used in groups to multiply current and can also be coupled to a microelectric circuit for providing power needs.

Abstract: A method and system for contact potential sensing of dielectric properties of a fluid. The method and system include a contact potential sensor, an open or closed loop for passing a fluid past the sensor, measuring a contact potential to characterize dielectric properties of the fluid and outputting the dielectric property information for analysis and response thereto.

Abstract: An ionization contact potential difference gyroscope including a housing enclosing a first and second electrode with a gas, further including an ionization source capable of providing ions from the gas, and a contact potential difference measurement circuit that is capable of measuring an electrical signal related to the amount of ions striking at least one of the two surfaces. The measurement circuit of the present invention is capable of sensing the small amount of electrical current flowing as the electrons and ions strike one or both of the surfaces.

Abstract: A non-vibrating capacitance probe for use as a non-contact sensor for tribological wear on a component. The device detects surface charge through temporal variation in the work function of a material. A reference electrode senses changing contact potential difference over the component surface, owing to compositional variation on the surface. Temporal variation in the contact potential difference induces a current through an electrical connection. This current is amplified and converted to a voltage signal by an electronic circuit with an operational amplifier.

Abstract: A system and method for mechanically forming a ceramic superconductor product. A system for making the ceramic superconductor includes a metallic channel portion having a cross section for receiving a ceramic superconductor powder, a roll to mechanically reduce the channel cross section and included superconductor powder and a cap portion welded to the channel portion using a localized high energy source. The assembled bar is then mechanically reduced to form a tape or wire end product.

Abstract: A non-vibrating capacitance probe for use as a non-contact sensor for tribological wear on a component. The device detects surface charge through temporal variation in the work function of a material. A reference electrode senses changing contact potential difference over the component surface, owing to compositional variation on the surface. Temporal variation in the contact potential difference induces a current through an electrical connection. This current is amplified and converted to a voltage signal by an electronic circuit with an operational amplifier.