Abstract: The efficiency of electronic design automation is increased by building, as an electronic data structure, a timing graph characterizing a putative integrated circuit design; identifying at least one of an edge and a node in the timing graph that requires canonical timing adjustment; and electronically calculating a deterministic timing adjustment for each of a plurality of corner cases. Based on the calculated deterministic timing adjustment for each of the plurality of corner cases, the canonical timing adjustment is determined for the at least one of an edge and a node; the canonical timing adjustment is applied to the timing graph; and the timing graph is updated based on the application of the canonical timing adjustment.

Abstract: The efficiency of electronic design automation is increased by building, as an electronic data structure, a timing graph characterizing a putative integrated circuit design; identifying at least one of an edge and a node in the timing graph that requires canonical timing adjustment; and electronically calculating a deterministic timing adjustment for each of a plurality of corner cases. Based on the calculated deterministic timing adjustment for each of the plurality of corner cases, the canonical timing adjustment is determined for the at least one of an edge and a node; the canonical timing adjustment is applied to the timing graph; and the timing graph is updated based on the application of the canonical timing adjustment.

Abstract: A system and method to perform an integrated circuit design involves selecting a net among a plurality of nets of the integrated circuit design as a victim net. Each net connects a pair of nodes of the integrated circuit design and each node represents a logic element of the integrated circuit design. The method also includes determining aggressor nets among the plurality of nets for the victim net and determining a corresponding weight value for each of the aggressor nets and, for each of the aggressor nets, multiplying the coupled noise originating from the aggressor net with the corresponding weight value to obtain a weighted coupled noise value. A cumulative coupled noise value is obtained for the victim net as a sum of the weighted coupled noise values associated with each of the aggressor nets. A result of the integrated circuit design is provided for fabrication into an integrated circuit.

Abstract: A method, system, and computer product for performing a coupled noise analysis in an integrated circuit (IC) design include copying one or more victim circuit sections of a victim circuit in the IC, generating a blockage circuit section that represents a blockage aggressor circuit in the IC, using the copied one or more victim circuit sections of the victim circuit, determining at least one subcircuit from the blockage circuit section, selecting, for a victim pin on the victim circuit, a power-driven virtual node on the at least one subcircuit, applying a power source to the power-driven virtual node on the at least one subcircuit, calculating a coupled noise at the victim pin contributed by the at least one subcircuit in response to the power source being applied, comparing the coupled noise to a threshold noise level, and altering the IC design when the coupled noise exceeds the threshold noise level.

Abstract: A system and method to perform an integrated circuit design involves selecting a net among a plurality of nets of the integrated circuit design as a victim net. Each net connects a pair of nodes of the integrated circuit design and each node represents a logic element of the integrated circuit design. The method also includes determining aggressor nets among the plurality of nets for the victim net and determining a corresponding weight value for each of the aggressor nets and, for each of the aggressor nets, multiplying the coupled noise originating from the aggressor net with the corresponding weight value to obtain a weighted coupled noise value. A cumulative coupled noise value is obtained for the victim net as a sum of the weighted coupled noise values associated with each of the aggressor nets. A result of the integrated circuit design is provided for fabrication into an integrated circuit.

Abstract: A method, system, and computer product for performing a coupled noise analysis in an integrated circuit (IC) design include copying one or more victim circuit sections of a victim circuit in the IC design, generating a blockage circuit section that represents a blockage aggressor circuit in the IC design, using the copied one or more victim circuit sections of the victim circuit, determining at least one subcircuit from the blockage circuit section, selecting, for a victim pin on the victim circuit, a power-driven virtual node on the at least one subcircuit, applying a power source to the power-driven virtual node on the at least one subcircuit, calculating a coupled noise at the victim pin contributed by the at least one subcircuit in response to the power source being applied, comparing the coupled noise to a threshold noise level, and altering the IC design when the coupled noise exceeds the threshold noise level.

Abstract: A method, system, and computer product for performing a coupled noise analysis in an integrated circuit (IC) design include copying one or more victim circuit sections of a victim circuit in the IC, generating a blockage circuit section that represents a blockage aggressor circuit in the IC, using the copied one or more victim sections of the victim circuit, determining at least one subcircuit from the blockage circuit section, selecting, for a victim pin on the victim circuit, a power-driven virtual node on the at least one subcircuit, applying a power source to the power-driven virtual node on the at least one subcircuit, calculating a coupled noise at the victim pin contributed by the at least one subcircuit in response to the power source being applied, comparing the coupled noise to a threshold noise level, and altering the IC design when the coupled noise exceeds the threshold noise level.

Abstract: A system to design an integrated circuit and a method of fabricating an integrated circuit include performing a design change for a net among a plurality of nets of the integrated circuit. An extraction is performed for the net and includes re-computing values for a resistor-capacitor (RC) circuit representation of the net. Re-computed values resulting from the re-computing and a timestamp of the extraction are recorded. A capacitance value of a capacitor coupling the net with a neighboring net in the RC circuit representation of the neighboring net is changed to be the capacitance value of the capacitor coupling the net with the neighboring net that was re-computed for the RC circuit representation of the net. Timing and noise parameters are for the net and the neighboring net are updated to updated timing and noise parameters, and timing analysis is performed based on the updated timing and noise parameters.

Abstract: A system to design an integrated circuit and a method of fabricating an integrated circuit include performing a design change for a net among a plurality of nets of the integrated circuit. An extraction is performed for the net and includes re-computing values for a resistor-capacitor (RC) circuit representation of the net. Re-computed values resulting from the re-computing and a timestamp of the extraction are recorded. A capacitance value of a capacitor coupling the net with a neighboring net in the RC circuit representation of the neighboring net is changed to be the capacitance value of the capacitor coupling the net with the neighboring net that was re-computed for the RC circuit representation of the net. Timing and noise parameters are for the net and the neighboring net are updated to updated timing and noise parameters, and timing analysis is performed based on the updated timing and noise parameters.

Abstract: A method, system, and computer product for performing a coupled noise analysis in an integrated circuit (IC) design include copying one or more victim circuit sections of a victim circuit in the IC, generating a blockage circuit section that represents a blockage aggressor circuit in the IC, using the copied one or more victim sections of the victim circuit, determining at least one subcircuit from the blockage circuit section, selecting, for a victim pin on the victim circuit, a power-driven virtual node on the at least one subcircuit, applying a power source to the power-driven virtual node on the at least one subcircuit, calculating a coupled noise at the victim pin contributed by the at least one subcircuit in response to the power source being applied, comparing the coupled noise to a threshold noise level, and altering the IC design when the coupled noise exceeds the threshold noise level.

Abstract: Methodologies for compact modeling of circuit layouts to accurately account for effects of layout-induced changes in semiconductor devices induced by various intentional and unintentional mechanisms present in semiconductor processes are disclosed. The layout-sensitive compact model accounts for the impact of large layout variation on circuits by implementing techniques for obtaining the correct layout-dependent response approximations and by incorporating layout extraction techniques to obtain correct geometric parameters that drive the LDE response. In particular, these techniques include utilizing shape sections for analyzing in detail various specific region shapes of the semiconductor device. The shape sections are defined by locating vertices of each region shape and rendering reference lines at each vertex.

Abstract: A method and apparratus for for identifying circuits within an integrated circuit design that are likely to latchup. The present invention accomplishes the identification by searching for suspect circuits and then modifying these circuits to represent a device known by an EDA tool (e.g. FET device). The EDA tool can then be used to determine the likelihood of latchup occuring based upon the modified device.

Abstract: A method and apparratus for for identifying circuits within an integrated circuit design that are likely to latchup. The present invention accomplishes the identification by searching for suspect circuits and then modifying these circuits to represent a device known by an EDA tool (e.g. FET device). The EDA tool can then be used to determine the likelihood of latchup occuring based upon the modified device.