Abstract: The present disclosure relates to adapter assemblies for use with and to electrically and mechanically interconnect electromechanical surgical devices and surgical reloads, and to surgical systems including handheld electromechanical surgical devices and adapter assemblies for connecting surgical reloads to the handheld electromechanical surgical devices.

Abstract: A method of aiding in the diagnosis or prediction of degenerative joint disease in a joint of a patient. The method comprises obtaining a test spectrum of Raman scattered radiation from cartilage tissue in the joint, and analyzing the test spectrum, or one or more regions thereof, to assess whether the test spectrum is consistent with the patient having, or subsequently developing, degenerative joint disease in the joint.

Abstract: A method of aiding in the diagnosis or prediction of degenerative joint disease in a joint of a patient. The method comprises obtaining a test spectrum of Raman scattered radiation from cartilage tissue in the joint, and analysing the test spectrum, or one or more regions thereof, to assess whether the test spectrum is consistent with the patient having, or subsequently developing, degenerative joint disease in the joint.

Abstract: Test circuitry for testing an integrated circuit, the integrated circuit being configurable to accept input data from stimulus scan cells and to provide output data to response scan cells, the test circuitry including stimulus circuitry for providing test data to the integrated circuit; input selection means operable to control which of the test data and the input data are received at the integrated circuit; capture circuitry for capturing output data from the integrated circuit and generating response data; output selection means operable to select which of the output data and the response data are received by the response scan cells.

Abstract: Test circuitry for testing an integrated circuit, the integrated circuit being configurable to accept input data from stimulus scan cells and to provide output data to response scan cells, the test circuitry including stimulus circuitry for providing test data to the integrated circuit; input selection means operable to control which of the test data and the input data are received at the integrated circuit; capture circuitry for capturing output data from the integrated circuit and generating response data; output selection means operable to select which of the output data and the response data are received by the response scan cells.