Abstract: An inspection system is provided for performing high speed inspection. The system includes a data source, one or more computers for processing the data, and a switched fabric for data distribution to the one or more computers.

Abstract: A method for part placement of a semiconductor chip for inspection where the semiconductor chip has a plurality of leads defining a seating plane and a body having a top. The method includes the steps of placing the body on a platform in an up position where the plurality of leads are suspended and probing the top of the body. Next measuring the position of the top of the body with reference to a predetermined coordinate system is done. Then the part is moved until the part is suspended on the plurality of leads on a reference plane. The top of the body is then probed for a second time, and the second position of the top of the body is measured with reference to the predetermined coordinate system. The thickness of the part is then determined as the distance between the top of the part and its seating plane.

Abstract: A part scanning and part calibration method for the inspection of printed circuit boards and integrated circuits includes a camera and two rotating mirrors to scan an image of a pattern mask retical upon which a precise pattern has been deposited. Small parts are placed upon the retical to be inspected. The third overhead mirror is provided to view the part under inspection from another perspective. The scene of the part is triangulated and the dimensions of the system can thus be calibrated. A precise retical mask is provided with dot patterns which provide an additional set of information needed for calibration. By scanning more than one dot pattern the missing state values can be resolved using an iterative trigonomic solution.

Abstract: A part scanning and part calibration apparatus and mechanism for the inspection of printed circuit boards and integrated circuits include a camera and two rotating mirrors to scan an image of a pattern mask retical upon which a precise pattern has been deposited. Small parts are placed upon the retical to be inspected. The third overhead mirror is provided to view the part under inspection from another perspective. The scene of the part is triangulated and the dimensions of the system can thus be calibrated. A precise retical mask is provided with dot patterns which provide an additional set of information needed for calibration. By scanning more then one dot pattern the missing state values can be resolved using an iterative trigonomic solution.