Abstract: A thermocouple device includes a shared conductor for a shunt measurement and a thermocouple measurement. For example, the thermocouple device may include a shared conductor that provides a signal to both calculate current of a shunt and calculate a temperature of the shunt. The thermocouple device may provide an efficient structure that accurately calculates current and temperature. In addition, the thermocouple device may use the temperature of the shunt to detect when a conductive path is overheating. The temperature of the shunt may also be used for other purposes.

Abstract: A thermocouple device includes a shared conductor for a shunt measurement and a thermocouple measurement. For example, the thermocouple device may include a shared conductor that provides a signal to both calculate current of a shunt and calculate a temperature of the shunt. The thermocouple device may provide an efficient structure that accurately calculates current and temperature. In addition, the thermocouple device may use the temperature of the shunt to detect when a conductive path is overheating. The temperature of the shunt may also be used for other purposes.

Abstract: A measurement system includes a current source that is arranged to generate a current pulse to charge a capacitor as a function of an input clock signal. The accumulated charge on the capacitor is converted to a sample (e.g., resultant digital value) by an ADC (analog-to-digital converter). The samples can be aggregated as a distribution in order to estimate the jitter of the input clock signal. Variability of the measurement system can be minimized through calibrating the device-under-test at specific points of PVT (process, voltage, and temperature) conditions. A confidence metric such as a standard of deviation can be derived from the associated samples. The measurement system can be included on a substrate that includes the oscillator that generates the input clock signal.

Abstract: Disclosed is a metrology assembly that utilizes a multi-Hall effect device configuration which eliminates the necessity of a magnetic concentrator. In some embodiments, the metrology assembly includes a substrate or support platform configured to support at least two Hall effect devices per phase of an electricity meter. The metrology assembly may further include one or more electrical conductors coupled to the substrate and configured to conduct electric current. The at least two Hall effect devices may be coupled to the substrate at opposing sides of an associated electrical conductor, each Hall effect device being configured to detect a magnetic field created by the electric current of the associated electrical conductor, and to generate an output.

Abstract: A measurement system includes a current source that is arranged to generate a current pulse to charge a capacitor as a function of an input clock signal. The accumulated charge on the capacitor is converted to a sample (e.g., resultant digital value) by an ADC (analog-to-digital converter). The samples can be aggregated as a distribution in order to estimate the jitter of the input clock signal. Variability of the measurement system can be minimized through calibrating the device-under-test at specific points of PVT (process, voltage, and temperature) conditions. A confidence metric such as a standard of deviation can be derived from the associated samples. The measurement system can be included on a substrate that includes the oscillator that generates the input clock signal.

Abstract: Disclosed is a metrology assembly that utilizes a multi-Hall effect device configuration which eliminates the necessity of a magnetic concentrator. In some embodiments, the metrology assembly includes a substrate or support platform configured to support at least two Hall effect devices per phase of an electricity meter. The metrology assembly may further include one or more electrical conductors coupled to the substrate and configured to conduct electric current. The at least two Hall effect devices may be coupled to the substrate at opposing sides of an associated electrical conductor, each Hall effect device being configured to detect a magnetic field created by the electric current of the associated electrical conductor, and to generate an output.

Abstract: Disclosed is a metrology assembly that utilizes a multi-Hall effect device configuration which eliminates the necessity of a magnetic concentrator. In some embodiments, the metrology assembly includes a substrate or support platform configured to support at least two Hall effect devices per phase of an electricity meter. The metrology assembly may further include one or more electrical conductors coupled to the substrate and configured to conduct electric current. The at least two Hall effect devices may be coupled to the substrate at opposing sides of an associated electrical conductor, each Hall effect device being configured to detect a magnetic field created by the electric current of the associated electrical conductor, and to generate an output.

Abstract: A measurement system includes a current source that is arranged to generate a current pulse to charge a capacitor as a function of an input clock signal. The accumulated charge on the capacitor is converted to a sample (e.g., resultant digital value) by an ADC (analog-to-digital converter). The samples can be aggregated as a distribution in order to estimate the jitter of the input clock signal. Variability of the measurement system can be minimized through calibrating the device-under-test at specific points of PVT (process, voltage, and temperature) conditions. A confidence metric such as a standard of deviation can be derived from the associated samples. The measurement system can be included on a substrate that includes the oscillator that generates the input clock signal.

Abstract: Disclosed is a metrology assembly that utilizes a multi-Hall effect device configuration which eliminates the necessity of a magnetic concentrator. In some embodiments, the metrology assembly includes a substrate or support platform configured to support at least two Hall effect devices per phase of an electricity meter. The metrology assembly may further include one or more electrical conductors coupled to the substrate and configured to conduct electric current. The at least two Hall effect devices may be coupled to the substrate at opposing sides of an associated electrical conductor, each Hall effect device being configured to detect a magnetic field created by the electric current of the associated electrical conductor, and to generate an output.