Patents by Inventor Steven Harold Slupsky

Steven Harold Slupsky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Non-contact tester for electronic circuits
    Patent number: 7109730
    Abstract: A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a micro-fabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible with the wireless i/o cell on the electronic circuit. This enables data to be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.
    Type: Grant
    Filed: April 25, 2005
    Date of Patent: September 19, 2006
    Assignee: Scanimetrics Inc.
    Inventor: Steven Harold Slupsky
  • Non-contact tester for electronic circuits
    Publication number: 20060066326
    Abstract: A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a micro-fabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible with the wireless i/o cell on the electronic circuit. This enables data to be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.
    Type: Application
    Filed: April 25, 2005
    Publication date: March 30, 2006
    Inventor: Steven Harold Slupsky
  • Non-contact tester for electronic circuits
    Patent number: 6885202
    Abstract: A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a micro-fabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible with the wireless i/o cell on the electronic circuit. This enables data to be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.
    Type: Grant
    Filed: September 19, 2003
    Date of Patent: April 26, 2005
    Assignee: Scanimetrics Inc.
    Inventor: Steven Harold Slupsky
  • Non-contact tester for electronic circuits
    Publication number: 20040075453
    Abstract: A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a microfabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible with the wireless i/o cell on the electronic circuit. This enables data to be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.
    Type: Application
    Filed: September 19, 2003
    Publication date: April 22, 2004
    Inventor: Steven Harold Slupsky