Abstract: The subject technology provides for an architecture that isolates two interfaces of a circuit with an isolating communication element while also protecting against overstress transients such as electro-static discharge (ESD) and other electrical overstress (EOS) transients across the isolating communication element that can be significantly larger than the ESD rating of the isolating communication element, and/or that may be repeated in succession. The subject technology provides isolation using a two die implementation with an isolation interface including an isolation tub in each die, or a single die containing both isolation tubs in the die. The two dice include respective substrates that are connected together and float with respect to any signal or ground. The isolation enables a large offset voltage on the order of hundreds of volts to exist between the sides. Being relatively large, each isolation tub can handle a significant amount of energy.

Abstract: The subject technology provides for an architecture that isolates two interfaces of a circuit with an isolating communication element while also protecting against overstress transients such as electro-static discharge (ESD) and other electrical overstress (EOS) transients across the isolating communication element that can be significantly larger than the ESD rating of the isolating communication element, and/or that may be repeated in succession. The subject technology provides isolation using a two die implementation with an isolation interface including an isolation tub in each die, or a single die containing both isolation tubs in the die. The two dice include respective substrates that are connected together and float with respect to any signal or ground. The isolation enables a large offset voltage on the order of hundreds of volts to exist between the sides. Being relatively large, each isolation tub can handle a significant amount of energy.

Abstract: A method and apparatus for testing ADC circuitry. The method and apparatus detects infrequently occurring errors by providing a series of waveforms to the ADC that have different amplitude, frequency, or voltage offset from one another. The outputs of the ADC for the waveforms are then analyzed for timing related errors.

Abstract: A structure and method for a field effect transistor capable of handling high currents, comprises interleaved source and drain diffusion regions with drain diffusion contacts to a first metal level over the drain diffusions only; while a second metal level covers the full width of the device and takes current out of the source in a primarily vertical direction.

Abstract: A method and apparatus for testing ADC circuitry. The method and apparatus detects infrequently occurring errors by providing a series of waveforms to the ADC that have different amplitude, frequency, or voltage offset from one another. The outputs of the ADC for the waveforms are then analyzed for timing related errors.

Abstract: A structure and method for a field effect transistor capable of handling high currents, comprises interleaved source and drain diffusion regions with drain diffusion contacts to a first metal level over the drain diffusions only; while a second metal level covers the full width of the device and takes current out of the source in a primarily vertical direction.

Abstract: A structure and method for a field effect transistor capable of handling high currents, comprises interleaved source and drain diffusion regions with drain diffusion contacts to a first metal level over the drain diffusions only; while a second metal level covers the full width of the device and takes current out of the source in a primarily vertical direction.

Abstract: A flash analog to digital converter includes a reference ladder, consisting primarily of resistors, a plurality of comparators, each coupled to a different reference voltage on the reference ladder (the comparators compare a received voltage with a reference voltage level developed across corresponding resistor or group of resistors), and a variable power source coupled to the reference ladder for varying the reference levels generated from the ladder. The structure includes a fixed (or variable) gain driver supplying the received signal voltage to the bank of comparators. The variable power source can be an adjustable current source or an adjustable voltage source. The comparators can be single-ended comparators or differential comparators.

Abstract: A method and structure for calibrating an analog to digital converter comprises an input signal; a driver receiving the input signal, wherein the driver outputs a driver output signal; a flash circuit receiving the driver output signal, wherein the flash circuit outputs a comparison result equaling 2n−1 digital outputs; an encoding logic unit encoding the comparison result into n digital bits as an output signal; a calibration engine outputting a calibration input adjust signal, a reference adjust signal, a driver gain adjust signal, a driver offset adjust signal; and a calibration input circuit receiving the calibration input adjust signal, wherein the driver receives the driver gain adjust signal and the driver offset adjust signal, wherein the flash circuit receives the reference adjust signal, wherein the calibration engine receives n digital bits, and controls an operation of the driver or flash circuit based on the output signal.

Abstract: A structure and method for a field effect transistor capable of handling high currents, comprises interleaved source and drain diffusion regions with drain diffusion contacts to a first metal level over the drain diffusions only; while a second metal level covers the full width of the device and takes current out of the source in a primarily vertical direction.

Abstract: A method and structure for calibrating an analog to digital converter comprises an input signal; a driver receiving the input signal, wherein the driver outputs a driver output signal; a flash circuit receiving the driver output signal, wherein the flash circuit outputs a comparison result equaling 2n−1 digital outputs; an encoding logic unit encoding the comparison result into n digital bits as an output signal; a calibration engine outputting a calibration input adjust signal, a reference adjust signal, a driver gain adjust signal, a driver offset adjust signal; and a calibration input circuit receiving the calibration input adjust signal, wherein the driver receives the driver gain adjust signal and the driver offset adjust signal, wherein the flash circuit receives the reference adjust signal, wherein the calibration engine receives n digital bits, and controls an operation of the driver or flash circuit based on the output signal.

Abstract: A flash analog to digital converter includes a reference ladder, consisting primarily of resistors, a plurality of comparators, each coupled to a different reference voltage on the reference ladder (the comparators compare a received voltage with a reference voltage level developed across corresponding resistor or group of resistors), and a variable power source coupled to the reference ladder for varying the reference levels generated from the ladder. The structure includes a fixed (or variable) gain driver supplying the received signal voltage to the bank of comparators. The variable power source can be an adjustable current source or an adjustable voltage source. The comparators can be single-ended comparators or differential comparators.

Abstract: A structure for an amplifier circuit which includes a pair of source-coupled differential transistors, each of source-coupled differential transistors having a body and a gate, and input transistors electrically connected to the source-coupled transistors. Also, the input transistors load the body and the gate of the source-coupled transistors with positive feedback signals. As a result, a differential gain is increased and a common mode gain is not increased. The output of the pair of source-coupled differential transistors is directed to second pair of transistors. The second pair of transistors generates mirrored voltages which track with input voltages. The second pair of transistors generates mirrored voltages translated by an offset voltage to values near ground, mirrored voltages which represent a voltage gain over an input voltage, and mirrored voltages which are largely differential and includes approximately no common mode input voltage.

Abstract: A write driver in an H configuration for magnetic inductive write heads characterized by having both arms in the bottom half of the driver conduct current all the time, with only the top devices being switched. In this configuration there is no need to synchronize the switching of the top and bottom halves of the H-driver. Furthermore, the device half being switched can be optimized for speed independent of the properties of the other H-driver half.

Abstract: A voltage boosting circuit for an "H-driver," providing for each "pull-up" switch in the H-driver a switching shunt that charges a capacitor from a supply voltage when the "pull-up" switch is open and couples the capacitor directly to the write head when the "pull-up" switch is closed. The side of the capacitor which is not directly coupled to the write head is coupled to the data signal (or its inverse, in the case of the capacitor for the otherwise identical circuit serving the parallel half of the "H-driver") through a buffer which sets the voltage at the signal level (or its inverse), thereby dumping the charge to the write head and elevating the voltage of the write head significantly above the supply voltage. The identical circuit serving the parallel half of the "H-driver" similarly boosts the negative going transition voltage.

Abstract: A circuit for detecting delay of more than a set period of time from a last signal transition for any of a plurality of data signals, comprising a differential comparator, and integrator pairs for each signal, one integrator of the pair being triggered by transition of the signal from low to high and the other triggered by transition of the inverse of the signal from low to high, each integrator having a voltage measured by the differential comparator against a reference voltage, each integrator being reset by the trigger for the other integrator.

Abstract: An improved current mirror circuit with isolation of the output leg for improved stabilization of the circuit even when heavily loaded.

Abstract: A circuit for converting received input signals to highly symmetrical CMOS level outputs having fast slew rates. The circuit can accept a differential input signal with a wide range of common mode voltages. A first stage level shifts the input signals to provide a ground-based common mode output to a second stage level shifter which centers the input signals around the midpoint between V.sub.cc and ground and which increases their voltage swing. The final stage provides a full, highly symmetric, rail-to-rail output capable of driving highly capacitive loads at high rates and which is immune to temperature, V.sub.cc, and process variations.