Abstract: In a first aspect, a method of testing an analog circuit is provided. The method includes (1) providing the analog circuit with a screening circuit adapted to cause the analog circuit to function like a logic gate during a test; and (2) applying digital signals to the analog circuit to test the analog circuit at a wafer level so as to detect a defect in one or more components of the analog circuit. Numerous other aspects are provided.

Abstract: Circuits and methods are provided for reducing the voltage stress applied to the drain to source conduction path of an FET and/or to reduce the stress to the gate oxide of an FET which may have a thin gate oxide. Thus, in a current mirror circuit disclosed herein, a first field effect transistor (FET) has a first gate and a first drain, in which the first drain is conductively connected to a current source for conducting a first current. The current mirror circuit also includes at least one second FET having a second gate conductively connected to the first gate, in which the second FET is operable to output a second current in fixed proportion to the first current. A switching element having a first conductive terminal is connected to the first gate and to the second gate, the second conductive terminal being connected to the first drain of the first FET.

Abstract: Methods and structures are disclosed herein for programmably adjusting a peaking function of a differential signal receiver. The disclosed method includes inputting a pair of differential signals to a pair of input transistors coupled to conduct currents differentially between a pair of load impedances and a pair of tail transistors. The impedance of an adjustable shunt impedance element between the tail transistors of the receiver is varied by programming signal input, such that higher current is conducted over a peaking range of frequencies. In a disclosed structural embodiment, an integrated circuit is provided having a programmable peaking receiver. The programmable peaking receiver includes a pair of input transistors coupled to conduct differentially according to a pair of differential inputs applied to the pair of input transistors. Each of the input transistors produces an output in accordance with the differential input applied thereto.

Abstract: Methods and structures are disclosed herein for programmably adjusting a peaking function of a differential signal receiver. The disclosed method includes inputting a pair of differential signals to a pair of input transistors coupled to conduct currents differentially between a pair of load impedances and a pair of tail transistors. The impedance of an adjustable shunt impedance element between the tail transistors of the receiver is varied by programming signal input, such that higher current is conducted over a peaking range of frequencies. In a disclosed structural embodiment, an integrated circuit is provided having a programmable peaking receiver. The programmable peaking receiver includes a pair of input transistors coupled to conduct differentially according to a pair of differential inputs applied to the pair of input transistors. Each of the input transistors produces an output in accordance with the differential input applied thereto.

Abstract: A multi emitter multi input BICMOS NAND circuit (30) is provided wherein an output node OUT connected to an output terminal (33) is coupled between pull up (31) and pull down (32) blocks. According to one embodiment of the present invention, the pull up block (32) is comprised of a plurality of identical basic cells, each comprised of a CMOS inverter (C31, C32) driving an NPN pull up transistor (T31, T32) mounted as an emitter follower. Logic signals (A31, A32) are applied on the inputs of the inverters (C31, C32), and the inverted signal (A31, A32) is available at the emitter of the emitter follower which corresponds to the output of the cell. All outputs are tied altogether to perform an OR function and are connected to said output terminal (33) to have a multi emitter like circuit.

Abstract: A BIFET logic circuit for quickly switching an output line from a high level to a reference level. The BICMOS circuit comprises a push-pull circuit including a first bipolar transistor for driving current into an output line, and a second bipolar transistor for sinking current from the output line; a CFET logic circuit for performing a logic function and including at least one N type FET for providing current to the base of the second bipolar transistor when a set of input lines to the CFET circuit has a first set of predetermined values; and a resistive means for connecting one of the source or drain of the at least one NFET to a power supply to provide a source of base current to the second bipolar transistor, even when the output line drops in voltage. This circuit is especially advantageous for driving low threshold CFET circuits.