Patents by Inventor Steven Joslin

Steven Joslin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for measuring polycrystalline chunk size and distribution in the charge of a Czochralski process
    Patent number: 6589332
    Abstract: A method and system for determining polycrystalline silicon chunk size for use with a Czochralski silicon growing process. Polycrystalline silicon chunks are arranged on a measuring background. A camera captures an image of the chunks. An image processor processes the image and determines the dimensions of the chunks based on the captured image. A size parameter associated with the chunks is determined.
    Type: Grant
    Filed: October 15, 1999
    Date of Patent: July 8, 2003
    Assignee: MEMC Electronic Materials, Inc.
    Inventors: John D. Holder, Steven Joslin, Hariprasad Sreedharamurthy, John Lhamon