Abstract: A semiconductor neutron detector and a semiconductor process is provided to manufacture a semiconductor neutron detector. First, a substrate with flat surface having a dielectric layer is formed thereon is provided. Thereafter, a masking pattern is applied and etched into the dielectric layer to expose semiconductor features on opposite sides of the substrate. The semiconductor substrate is submerged into an etchant composed of a semiconductor etching solution to etch deep cavities into the substrate in the exposed regions. Afterwards, dopant impurities are introduced and are driven into the semiconductor, under high temperature, into opposite sides of the etched features to produce one or more rectifying junctions. Afterwards, LiF and/or B particles are forced into the cavities through high velocity methods.

Abstract: A neutron detection apparatus includes a neutron detector and an analyzer. The neutron detector includes a plurality of neutron detector assemblies, where each of the neutron detector assemblies includes a plurality of neutron detection devices. The neutron detector also includes a moderating volume. The plurality of neutron detector assemblies are disposed within the moderating volume so as to form a three-dimensional array of neutron detection devices within the moderating volume. The analyzer is communicatively coupled to each of the neutron detection devices of the plurality of neutron detector assemblies. The analyzer configured to receive one or more measured response signals from each of the neutron detection devices, and perform one or more analysis procedures to determine one or more characteristics associated with the one or more neutron sources based at least on the received one or more measured response signals.

Abstract: A neutron detection apparatus includes a neutron detector and an analyzer. The neutron detector includes a plurality of neutron detector assemblies, where each of the neutron detector assemblies includes a plurality of neutron detection devices. The neutron detector also includes a moderating volume. The plurality of neutron detector assemblies are disposed within the moderating volume so as to form a three-dimensional array of neutron detection devices within the moderating volume. The analyzer is communicatively coupled to each of the neutron detection devices of the plurality of neutron detector assemblies. The analyzer configured to receive one or more measured response signals from each of the neutron detection devices, and perform one or more analysis procedures to determine one or more characteristics associated with the one or more neutron sources based at least on the received one or more measured response signals.

Abstract: A neutron detection system may include a neutron detector including a plurality of neutron detection devices, a plurality of discrete neutron moderating elements, wherein each of the neutron moderating elements is disposed between two or more neutron detection devices, the plurality of neutron detection devices and the plurality of discrete neutron moderating elements disposed along a common axis, a control system configured to generate a detector response library, wherein the detector response library includes one or more sets of data indicative of a response of the detector to a known neutron source, receive one or more measured neutron response signals from each of the neutron devices, the one or more measured response signals response to a detected neutron event, and determine one or more characteristics of neutrons emanating from a measured neutron source by comparing the one or more measured neutron response signals to the detector response library.

Abstract: A semiconductor neutron detector and a semiconductor process is provided to manufacture a semiconductor neutron detector. First, a substrate with flat surface having a dielectric layer is formed thereon is provided. Thereafter, a masking pattern is applied and etched into the dielectric layer to expose semiconductor features on opposite sides of the substrate. The semiconductor substrate is submerged into an etchant composed of a semiconductor etching solution to etch deep cavities into the substrate in the exposed regions. Afterwards, dopant impurities are introduced and are driven into the semiconductor, under high temperature, into opposite sides of the etched features to produce one or more rectifying junctions. Afterwards, LiF and/or B particles are forced into the cavities through high velocity methods.

Abstract: A neutron detection system includes a plurality of neutron detector assemblies, the neutron detector assemblies including a plurality of neutron detection devices, wherein the neutron detection devices are configured to detect one or more characteristics of neutrons emanating from one or more neutron sources and impinging on one or more neutron detection devices; a plurality of discrete moderating elements, wherein each of the discrete moderating elements is disposed proximate to at least one neutron detector assembly, the plurality of neutron detector assemblies and the plurality of discrete moderating elements disposed along a common axis, wherein the discrete moderating elements are configured to moderate the energy of neutrons impinging on one or more of the neutron-photon detector assemblies; and a control system configured to: determine one or more characteristics associated with the one or more neutron sources based on the received one or more measured response signals.

Abstract: A neutron detection system may include a neutron detector including a plurality of neutron detection devices, a plurality of discrete neutron moderating elements, wherein each of the neutron moderating elements is disposed between two or more neutron detection devices, the plurality of neutron detection devices and the plurality of discrete neutron moderating elements disposed along a common axis, a control system configured to generate a detector response library, wherein the detector response library includes one or more sets of data indicative of a response of the detector to a known neutron source, receive one or more measured neutron response signals from each of the neutron devices, the one or more measured response signals response to a detected neutron event, and determine one or more characteristics of neutrons emanating from a measured neutron source by comparing the one or more measured neutron response signals to the detector response library.

Abstract: A method of making a neutron detector such as a microstructured semiconductor neutron detector is provided. The method includes the step of providing a particle-detecting substrate having a surface and a plurality of cavities extending into the substrate from the surface. The method also includes filling the plurality of cavities with a neutron-responsive material. The step of filling including the step of centrifuging nanoparticles of the neutron-responsive material with the substrate for a time and a rotational velocity sufficient to backfill the cavities with the nanoparticles. The material is responsive to neutrons absorbed, thereby, for releasing ionizing radiation reaction products.

Abstract: A method of making a neutron detector such as a microstructured semiconductor neutron detector is provided. The method includes the step of providing a particle-detecting substrate having a surface and a plurality of cavities extending into the substrate from the surface. The method also includes filling the plurality of cavities with a neutron-responsive material. The step of filling including the step of centrifuging nanoparticles of the neutron-responsive material with the substrate for a time and a rotational velocity sufficient to backfill the cavities with the nanoparticles.

Abstract: Gas-filled neutron detectors, an imaging system and an array of such detectors are provided. Surfaces or surface portions incorporated into the gas-filled neutron detectors are coated with and/or composed of at least partially, neutron reactive material. The surfaces may be flat or curved, fins or plates, foils, thin sheets, porous or filamentary material, or semi-solid material or aerogel. The incorporation of the extended surfaces coated with or composed of neutron reactive material increases the neutron detection efficiency of the gas-filled detectors. The surfaces can be made of conductive, semiconductive, semi-insulating, or insulative materials. The surfaces are arranged such that they do not detrimentally detract from the main function of a gas-filled detector with particular attention to gas-filled proportional detectors. The surfaces may be arranged in the detectors to allow for modular construction.

Abstract: Surfaces or surface portions incorporated into gas-filled neutron detectors are coated with and/or composed of at least partially, neutron reactive material. The surfaces may be flat or curved fins or plates, foils, porous or filamentary material, or semi-solid material or aerogel. The incorporation of the extended surfaces coated with or composed of neutron reactive material increases the neutron detection efficiency of the gas-filled detectors over conventional coated designs. These surfaces or surface portions increase the amount of neutron reactive material present in the detector over conventional coated designs and, as a result, increase the neutron detection efficiency. The surfaces can be made of conductive, semiconductive or insulative materials. The surfaces are arranged such that they do not detrimentally detract from the main function of a gas-filled detector with particular attention to gas-filled proportional detectors.

Abstract: Surfaces or surface portions incorporated into gas-filled neutron detectors are coated with and/or composed of at least partially, neutron reactive material. The surfaces may be flat or curved fins or plates, foils, porous or filamentary material, or semi-solid material or aerogel. The incorporation of the extended surfaces coated with or composed of neutron reactive material increases the neutron detection efficiency of the gas-filled detectors over conventional coated designs. These surfaces or surface portions increase the amount of neutron reactive material present in the detector over conventional coated designs and, as a result, increase the neutron detection efficiency. The surfaces can be made of conductive, semiconductive or insulative materials. The surfaces are arranged such that they do not detrimentally detract from the main function of a gas-filled detector with particular attention to gas-filled proportional detectors.

Abstract: Non-streaming high-efficiency perforated semiconductor neutron detectors, method of making same and measuring wands and detector modules utilizing same are disclosed. The detectors have improved mechanical structure, flattened angular detector responses, and reduced leakage current. A plurality of such detectors can be assembled into imaging arrays, and can be used for neutron radiography, remote neutron sensing, cold neutron imaging, SNM monitoring, and various other applications.

Abstract: Non-streaming high-efficiency perforated semiconductor neutron detectors, method of making same and measuring wands and detector modules utilizing same are disclosed. The detectors have improved mechanical structure, flattened angular detector responses, and reduced leakage current. A plurality of such detectors can be assembled into imaging arrays, and can be used for neutron radiography, remote neutron sensing, cold neutron imaging, SNM monitoring, and various other applications.